GSektion G — PhysikSECTION G — PHYSICS
InstrumenteINSTRUMENTS
disable hierarchy mode: G01G01Messen; PrüfenMEASURING; TESTING
disable hierarchy mode: G01QG01QRastersondentechniken oder Vorrichtungen hierfür; Anwendung von Rastersondentechniken, z.B. Rastersondenmikroskopie [Scanning-Probe Microscopy = SPM] [2010.01]SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] [2010.01]
disable hierarchy mode: G01Q 60/00Link to Depatisnet beginner's search with IPC symbol: G01Q 60/00G01Q 60/00Besondere Arten der Rastersondenmikroskopie [SPM] oder Vorrichtungen hierfür; wesentliche Bestandteile hiervon [2010.01]Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof [2010.01]
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. Kraftmikroskopie [Atomic Force Microscopy = AFM] und Vorrichtungen hierfür, z.B. AFM-Sonden [2010.01]
. AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes [2010.01]
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. . Potential-Rastermikroskopie [2010.01]
. . Scanning potential microscopy [2010.01]