GSektion G — PhysikSECTION G — PHYSICS
InstrumenteINSTRUMENTS
disable hierarchy mode: G01G01Messen; PrüfenMEASURING; TESTING
disable hierarchy mode: G01QG01QRastersondentechniken oder Vorrichtungen hierfür; Anwendung von Rastersondentechniken, z.B. Rastersondenmikroskopie [Scanning-Probe Microscopy = SPM] [2010.01]SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] [2010.01]
disable hierarchy mode: G01Q 10/00Link to Depatisnet beginner's search with IPC symbol: G01Q 10/00G01Q 10/00Abtast- oder Positionieranordnungen, d.h. Anordnungen zur aktiven Steuerung der Bewegung oder der Position der Sonde [2010.01]Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe [2010.01]
disable hierarchy mode: G01Q 10/04Link to Depatisnet beginner's search with IPC symbol: G01Q 10/04G01Q 10/04
. Feines Abtasten (Scannen) oder Positionieren  [2010.01]
. Fine scanning or positioning [2010.01]
disable hierarchy mode: G01Q 10/06Link to Depatisnet beginner's search with IPC symbol: G01Q 10/06G01Q 10/06
. . Schaltungen oder Algorithmen hierfür [2010.01]
. . Circuits or algorithms therefor [2010.01]