H04N 25/78
Definition
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Readout circuits for addressed image sensors defining details related to the column readout lines and the circuits associated with them. Although the readout lines are placed in the sensor array, they are a functional part of the readout circuits.
These details are, for example, readout arrangements with:
- several column readout lines per column of pixels;
- column lines connectable by switches to perform analogue signal averaging/binning;
- multiple column lines are multiplexed to be processed by common processing means, like CDS, ADC, buffers;
- column lines connectable to different processing means (CDS, ADC, buffers) to randomise the column pattern noise;
- column lines randomly connectable to different processing means (CDS, ADC, buffers) to randomise the column pattern noise;
- a column line being shared for pixels in a row;
- several storage capacitors per column used for CDS, binning, multi frame storage, etc;
- reset or clamping circuits connected to the column lines.
Details related to the load circuit, e. g. current source of the source follower and control thereof.
Details related to ADC circuits (ADC circuits as such – group H03M 1/12) used in sensor array readout circuits.
These details are for example, related to:
- ADC type, like single slope, flash, SAR, sigma-delta, ADC combined with the gain of a programmable gain amplifier (ADC of this type as such group H03M 1/18);
- ADC arrangement in the readout circuit;
- ADC arranged per-column or for group of columns;
- ADC arranged at the output of the sensor;
- ADC ramp voltage generation - different slopes and directions, non-linear, ramp amplitude;
- Processing implemented in the ADC, like CDS, binning.
- Details related to output amplifiers:
- CTIA amplifiers (normally used in passive image sensors);
- Amplifiers with controllable gain GCA, PGA;
- Amplifiers arranged per-column or for group of columns;
- Amplifiers arranged at the output of the sensor.
- Details of arrangement of the CDS circuit as part of the readout circuit:
- CDS arranged per column;
- CDS arranged at the output of the sensor.
- CDS circuits as such are classified in group H04N 25/616.
Querverweise
Informative Querverweise
| Amplifiers per se | H03F |
| Analogue/digital conversion per se | H03M 1/00 |
H04N 25/78
Definition Statement
This place covers:Readout circuits for addressed image sensors defining details related to the column readout lines and the circuits associated with them. Although the readout lines are placed in the sensor array, they are a functional part of the readout circuits.
These details are, for example, readout arrangements with:
- several column readout lines per column of pixels;
- column lines connectable by switches to perform analogue signal averaging/binning;
- multiple column lines are multiplexed to be processed by common processing means, like CDS, ADC, buffers;
- column lines connectable to different processing means (CDS, ADC, buffers) to randomise the column pattern noise;
- column lines randomly connectable to different processing means (CDS, ADC, buffers) to randomise the column pattern noise;
- a column line being shared for pixels in a row;
- several storage capacitors per column used for CDS, binning, multi frame storage, etc;
- reset or clamping circuits connected to the column lines.
Details related to the load circuit, e. g. current source of the source follower and control thereof.
Details related to ADC circuits (ADC circuits as such – group H03M 1/12) used in sensor array readout circuits.
These details are for example, related to:
- ADC type, like single slope, flash, SAR, sigma-delta, ADC combined with the gain of a programmable gain amplifier (ADC of this type as such group H03M 1/18);
- ADC arrangement in the readout circuit;
- ADC arranged per-column or for group of columns;
- ADC arranged at the output of the sensor;
- ADC ramp voltage generation - different slopes and directions, non-linear, ramp amplitude;
- Processing implemented in the ADC, like CDS, binning.
- Details related to output amplifiers:
- CTIA amplifiers (normally used in passive image sensors);
- Amplifiers with controllable gain GCA, PGA;
- Amplifiers arranged per-column or for group of columns;
- Amplifiers arranged at the output of the sensor.
- Details of arrangement of the CDS circuit as part of the readout circuit:
- CDS arranged per column;
- CDS arranged at the output of the sensor.
- CDS circuits as such are classified in group H04N 25/616.
References
Informative references
| Amplifiers per se | H03F |
| Analogue/digital conversion per se | H03M 1/00 |