H04N 25/671

Definition

Diese Klassifikationsstelle umfasst:

(Für diese Definition ist die deutsche Übersetzung noch nicht abgeschlossen)

Circuits and arrangements for correcting and detecting of non-uniformity caused by sensor characteristics such as:

• different pixel characteristics – sensitivity, gain, offset, response curve;
• different characteristics of sampling circuits, amplifiers, ADCs used for different groups of pixels;
• the resistive or capacitive properties of long readout or control lines.

Circuits and arrangements for correcting and detecting of non-uniformity by

• using dummy pixels and/or dummy structures, not OB pixels for detecting offset variations;
• using correction circuits for correcting gain variations between pixels or groups of pixels;
• performing measurement of the gain variations;
• using correction circuits for correcting offset variations between pixels or groups of pixels;
• performing measurement of the offset variations.

Non-uniformity correction modes for

• measuring the gain responses of the pixels;
• measuring the offset responses of the pixels.

Beziehungen zu anderen Klassifikationsstellen

There is a certain similarity between the circuits and methods for correcting dark current ( H04N 25/63) and for correcting offset non-uniformities of the pixels. Since both can be temperature dependent, both can be corrected by using a dark frame.

H04N 25/671

Definition Statement

This place covers:

Circuits and arrangements for correcting and detecting of non-uniformity caused by sensor characteristics such as:

• different pixel characteristics – sensitivity, gain, offset, response curve;
• different characteristics of sampling circuits, amplifiers, ADCs used for different groups of pixels;
• the resistive or capacitive properties of long readout or control lines.

Circuits and arrangements for correcting and detecting of non-uniformity by

• using dummy pixels and/or dummy structures, not OB pixels for detecting offset variations;
• using correction circuits for correcting gain variations between pixels or groups of pixels;
• performing measurement of the gain variations;
• using correction circuits for correcting offset variations between pixels or groups of pixels;
• performing measurement of the offset variations.

Non-uniformity correction modes for

• measuring the gain responses of the pixels;
• measuring the offset responses of the pixels.

Relationships with other classification places

There is a certain similarity between the circuits and methods for correcting dark current ( H04N 25/63) and for correcting offset non-uniformities of the pixels. Since both can be temperature dependent, both can be corrected by using a dark frame.