IPC-Stelle: G01R 33/14 [Version 7 (gültig ab 01.2000)]

SymbolTypTitel
GSKPHYSICS
G01USKINSTRUMENTS
G01KLMEASURING (counting G06M); TESTING
G01RUKLMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (measuring physical variables of any kind by conversion into electric variables, see Note (4) following the title of class G01; measuring diffusion of ions in an electric field, e.g. electrophoresis, electro-osmosis, G01N; investigating non-electric or non-magnetic properties of materials by using electric or magnetic methods G01N; indicating correct tuning of resonant circuits H03J 3/12; monitoring electronic pulse counters H03K 21/40; monitoring operation of communication systems H04)
G01R 1/00HGRDetails of instruments or arrangements of the types included in groups G01R 5/00 to G01R 13/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) [3]
G01R 1/02UGR1
.General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00)
G01R 1/04UGR2
. .Housings; Supporting members; Arrangements of terminals (terminals H01R; terminal strips or boards H02B; housings for electrical apparatus H05K)
G01R 1/06UGR2
. .Measuring leads; Measuring probes (G01R 19/145 , G01R 19/165 take precedence; end pieces for leads H01R 11/00) [3]
G01R 1/067UGR3
. . .Measuring probes [3]
G01R 1/07UGR4
. . . .Non contact-making probes [6]
G01R 1/073UGR4
. . . .Multiple probes [3]
G01R 1/08UGR2
. .Pointers; Scales, Scale illumination
G01R 1/10UGR2
. .Arrangements of bearings (bearings in general F16C)
G01R 1/12UGR3
. . .of strip or wire bearings
G01R 1/14UGR2
. .Braking arrangements; Damping arrangements
G01R 1/16UGR2
. .Magnets (in general H01F)
G01R 1/18UGR2
. .Screening arrangements against electric or magnetic fields, e.g. against earth's field
G01R 1/20UGR1
.Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments (instrument transformers per se H01F 38/20)
G01R 1/22UGR2
. .Tong testers acting as secondary windings of current transformers (voltage or current isolation using transformers G01R 15/18)
G01R 1/24UGR2
. .Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section
G01R 1/26UGR3
. . .with linear movement of probe
G01R 1/28UGR1
.Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
G01R 1/30UGR1
.Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
G01R 1/36UGR1
.Overload-protection arrangements or circuits for electric measuring instruments (in general H02H)
G01R 1/38UGR1
.Arrangements for altering the indicating characteristic, e.g. by modifying the air gap (circuits G01D 3/02)
G01R 1/40UGR1
.Modifications of instruments to indicate the maximum or the minimum value reached in a time interval, e.g. by maximum indicator pointer [3]
G01R 1/42UGR2
. .thermally operated
G01R 1/44UGR1
.Modifications of instruments for temperature compensation [2]
G01R 3/00HGRApparatus or processes specially adapted for the manufacture of measuring instruments
G01R 5/00HGRInstruments for converting a single current or a single voltage into a mechanical displacement (vibration galvanometers G01R 9/02)
G01R 5/02UGR1
.Moving-coil instruments
G01R 5/04UGR2
. .with magnet external to the coil
G01R 5/06UGR2
. .with core magnet
G01R 5/08UGR2
. .specially adapted for wide angle deflection; with eccentrically-pivoted moving coil
G01R 5/10UGR1
.String galvanometers
G01R 5/12UGR1
.Loop galvanometers
G01R 5/14UGR1
.Moving-iron instruments
G01R 5/16UGR2
. .with pivoting magnet
G01R 5/18UGR2
. .with pivoting soft iron, e.g. needle galvanometer
G01R 5/20UGR1
.Induction instruments e.g. Ferraris instruments
G01R 5/22UGR1
.Thermoelectric instruments (measuring effective values of currents or voltages using thermoconverters G01R 19/03)
G01R 5/24UGR2
. .operated by elongation of a strip or wire or by expansion of a gas or fluid
G01R 5/26UGR2
. .operated by deformation of a bimetallic element
G01R 5/28UGR1
.Electrostatic instruments (combined with radiation detector G01T)
G01R 5/30UGR2
. .Leaf electrometers
G01R 5/32UGR2
. .Wire electrometers; Needle electrometers
G01R 5/34UGR2
. .Quadrant electrometers
G01R 7/00HGRInstruments capable of converting two or more currents or voltages into a single mechanical displacement (G01R 9/00 takes precedence)
G01R 7/02UGR1
.for forming a sum or a difference
G01R 7/04UGR1
.for forming a quotient (for measuring resistance G01R 27/08)
G01R 7/06UGR2
. .moving-iron type
G01R 7/08UGR2
. .moving-coil type, e.g. crossed-coil type
G01R 7/10UGR3
. . .having more than two moving coils
G01R 7/12UGR1
.for forming product
G01R 7/14UGR2
. .moving-iron type
G01R 7/16UGR2
. .having both fixed and moving coils, i.e. dynamometers
G01R 7/18UGR3
. . .with iron core magnetically coupling fixed and moving coils
G01R 9/00HGRInstruments employing mechanical resonance
G01R 9/02UGR1
.Vibration galvanometers, e.g. for measuring current
G01R 9/04UGR1
.using vibrating reeds, e.g. for measuring frequency
G01R 9/06UGR2
. .magnetically driven
G01R 9/08UGR2
. .piezo-electrically driven
G01R 11/00HGRElectromechanical arrangements for measuring time integral of electric power or current, e.g. of consumption (other arrangements therefor G01R 22/00; monitoring electric consumption of electrically-propelled vehicles B60L 3/00)
G01R 11/02UGR1
.Constructional details (applicable to electric measuring instruments in general G01R 1/00)
G01R 11/04UGR2
. .Housings; Supporting racks; Arrangements of terminals
G01R 11/06UGR2
. .Magnetic circuits of induction meters [2]
G01R 11/067UGR3
. . .Coils therefor [2]
G01R 11/073UGR3
. . .Armatures therefor [2]
G01R 11/09UGR4
. . . .Disc armatures [2]
G01R 11/10UGR2
. .Braking magnets; Damping arrangements
G01R 11/12UGR2
. .Arrangements of bearings (bearings in general F16C)
G01R 11/14UGR3
. . .with magnetic relief
G01R 11/16UGR2
. .Adaptations of counters to electricity meters
G01R 11/17UGR2
. .Compensating for errors; Adjusting or regulating means therefor [2]
G01R 11/18UGR3
. . .Compensating for variations in ambient conditions [2]
G01R 11/185UGR4
. . . .Temperature compensation [2]
G01R 11/19UGR3
. . .Compensating for errors caused by disturbing torque, e.g. rotating-field errors of polyphase meters [2]
G01R 11/20UGR3
. . .Compensating for phase errors in induction meters [2]
G01R 11/21UGR3
. . .Compensating for errors caused by damping effects of the current, e.g. adjustment in the overload range [2]
G01R 11/22UGR3
. . .Adjusting torque, e.g. adjusting starting torque, adjusting of polyphase meters for obtaining equal torques [2]
G01R 11/23UGR3
. . .Compensating for errors caused by friction, e.g. adjustment in the light-load range [2]
G01R 11/24UGR2
. .Arrangements for avoiding or indicating fraudulent use [4]
G01R 11/25UGR2
. .Arrangements for indicating or signalling faults [2, 4]
G01R 11/30UGR1
.Dynamo-electric motor meters
G01R 11/32UGR2
. .Watt-hour meters
G01R 11/34UGR2
. .Amp%$re-hour meters
G01R 11/36UGR1
.Induction meters, e.g. Ferraris meters (Ferraris instruments G01R 5/20)
G01R 11/38UGR2
. .for single-phase operation
G01R 11/40UGR2
. .for polyphase operation
G01R 11/42UGR3
. . .Circuitry therefor
G01R 11/46UGR1
.Electrically-operated clockwork meters; Oscillatory meters; Pendulum meters
G01R 11/48UGR1
.Meters specially adapted for measuring real or reactive components; Meters specially adapted for measuring apparent energy
G01R 11/50UGR2
. .for measuring real component
G01R 11/52UGR2
. .for measuring reactive component
G01R 11/54UGR2
. .for measuring simultaneously at least two of the following three variables: real component, reactive component, apparent energy
G01R 11/56UGR1
.Special tariff meters (tariff metering in general G01D 4/00)
G01R 11/57UGR2
. .Multi-rate meters (G01R 11/63 takes precedence) [2]
G01R 11/58UGR3
. . .Tariff-switching devices therefor [2]
G01R 11/60UGR2
. .Subtraction meters; Meters measuring maximum or minimum-load hours
G01R 11/63UGR2
. .Over-consumption meters, e.g. measuring consumption while a predetermined level of power is exceeded [2]
G01R 11/64UGR2
. .Maximum meters, e.g. tariff for a period is based on maximum demand within that period
G01R 11/66UGR3
. . .Circuitry
G01R 13/00HGRArrangements for displaying electric variables or waveformes (display by mechanical displacement only G01R 5/00 , G01R 7/00 , G01R 9/00; recording frequency spectrum G01R 23/18) [4]
G01R 13/02UGR1
.for displaying measured electric variables in digital form (counters G06M; analogue/digital conversion in general H03M 1/00) [4]
G01R 13/04UGR1
.for producing permanent records [4]
G01R 13/06UGR2
. .Modifications for recording transient disturbances, e.g. by starting or accelerating a recording medium
G01R 13/08UGR2
. .Electromechanical recording system using a mechanical direct-writing method
G01R 13/10UGR3
. . .with intermittent recording by representing the variable by the length of a stroke or by the position of a dot
G01R 13/12UGR2
. .Chemical recording, e.g. clydonographs (G01R 13/14 takes precedence)
G01R 13/14UGR2
. .Recording on a light-sensitive material
G01R 13/16UGR2
. .Recording on a magnetic medium
G01R 13/18UGR3
. . .using boundary displacement
G01R 13/20UGR1
.Cathode-ray oscilloscopes (cathode-ray tubes H01J 31/00)
G01R 13/22UGR2
. .Circuits therefor (circuits for generating pulses, e.g. sawtooth waveforms H03K 3/00)
G01R 13/24UGR3
. . .Time-base deflection circuits
G01R 13/26UGR3
. . .Circuits for controlling the intensity of the electron beam (brilliance control H01J 29/98)
G01R 13/28UGR3
. . .Circuits for simultaneous or sequential presentation of more than one variable (electronic switches H03K 17/00)
G01R 13/30UGR3
. . .Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking
G01R 13/32UGR3
. . .Circuits for displaying non-recurrent functions such as transients; Circuits for triggering; Circuits for synchronisation; Circuits for time-base expansion
G01R 13/34UGR3
. . .Circuits for representing a single waveform by sampling, e.g. for very high frequencies (sample-and-hold arrangements G11C 27/02) [2]
G01R 13/36UGR1
.using length of glow discharge, e.g. glowlight oscilloscopes (discharge tubes H01J) [4]
G01R 13/38UGR1
.using the steady or oscillatory displacement of a light beam by an electromechanical measuring system (such measuring systems per se G01R 5/00 , G01R 7/00 , G01R 9/00) [4]
G01R 13/40UGR1
.using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect [4]
G01R 13/42UGR1
.Instruments using length of spark discharge, e.g. by measuring maximum separation of electrodes to produce spark
G01R 15/00HGRDetails of measuring arrangements of the types provided for in groups G01R 17/00 to G01R 29/00 and G01R 33/00 to G01R 35/00 (details of instruments G01R 1/00; measuring leads, measuring probes G01R 1/06; overload protection arrangements G01R 1/36; circuits for correcting the transfer function G01D 3/02)
G01R 15/04UGR1
.Voltage dividers [6]
G01R 15/06UGR2
. .having reactive components, e.g. capacitive transformer [6]
G01R 15/08UGR1
.Circuits for altering the measuring range
G01R 15/09UGR2
. .Autoranging circuits [6]
G01R 15/12UGR1
.Circuits for multi-testers, e.g. for measuring voltage, current, or impedance at will
G01R 15/14UGR1
.Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks (voltage dividers G01R 15/04) [6]
G01R 15/16UGR2
. .using capacitive devices [6]
G01R 15/18UGR2
. .using inductive devices, e.g. transformers [6]
G01R 15/20UGR2
. .using galvano-magnetic devices, e.g. Hall-effect devices [6]
G01R 15/22UGR2
. .using light-emitting devices, e.g. LED, optocouplers [6]
G01R 15/24UGR2
. .using light-modulating devices [6]
G01R 15/26UGR2
. .using modulation of waves other than light, e.g. radio or acoustic waves [6]
G01R 17/00HGRMeasuring arrangements involving comparison with a reference value, e.g. bridge
G01R 17/02UGR1
.Arrangements in which the value to be measured is automatically compared with a reference value
G01R 17/04UGR2
. .in which the reference value is continuously or periodically swept over the range of values to be measured
G01R 17/06UGR2
. .Automatic balancing arrangements
G01R 17/08UGR3
. . .in which a force or torque representing the measured value is balanced by a force or torque representing the reference value
G01R 17/10UGR1
.ac or dc measuring bridges (automatic comparison or re-balancing arrangements G01R 17/02)
G01R 17/12UGR2
. .using comparison of currents, e.g. bridges with differential current output
G01R 17/14UGR2
. .with indication of measured value by calibrated null indicator, e.g. percent bridge, tolerance bridge (G01R 17/12 , G01R 17/16 take precedence)
G01R 17/16UGR2
. .with discharge tubes or semiconductor devices in one or more arms of the bridge, e.g. voltmeter using a difference amplifier
G01R 17/18UGR2
. .with more than four branches
G01R 17/20UGR1
.ac or dc potentiometric measuring arrangements (automatic comparison or re-balancing arrangements G01R 17/02)
G01R 17/22UGR2
. .with indication of measured value by calibrated null indicator
G01R 19/00HGRArrangements for measuring currents or voltages or for indicating presence or sign thereof (G01R 5/00 takes precedence; for measuring bioelectric currents or voltages A61B 5/04) [4]
G01R 19/02UGR1
.Measuring effective values, i.e. root-mean-square values
G01R 19/03UGR2
. .using thermoconverters [4]
G01R 19/04UGR1
.Measuring peak values of ac or of pulses [2]
G01R 19/06UGR1
.Measuring real component; Measuring reactive component
G01R 19/08UGR1
.Measuring current density
G01R 19/10UGR1
.Measuring sum, difference, or ratio
G01R 19/12UGR1
.Measuring rate of change
G01R 19/14UGR1
.Indicating direction of current; Indicating polarity of voltage
G01R 19/145UGR1
.Indicating the presence of current or voltage [3]
G01R 19/15UGR2
. .Indicating the presence of current [3]
G01R 19/155UGR2
. .Indicating the presence of voltage [3]
G01R 19/165UGR1
.Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values (circuits with regenerative action, e.g. Schmitt trigger H03K 3/00; threshold switches H03K 17/00) [3]
G01R 19/17UGR2
. .giving an indication of the number of times this occurs [3]
G01R 19/175UGR1
.Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero [3]
G01R 19/18UGR1
.using conversion of dc into ac, e.g. with choppers
G01R 19/20UGR2
. .using transductors
G01R 19/22UGR1
.using conversion of ac into dc
G01R 19/25UGR1
.using digital measurement techniques (arrangements for displaying measured electric variables in digital form G01R 13/02) [3]
G01R 19/252UGR2
. .using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency [4]
G01R 19/255UGR2
. .using analogue/digital converters of the type with counting of pulses during a period of time proportional to voltage or current, delivered by a pulse generator with fixed frequency [4]
G01R 19/257UGR2
. .using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method [4]
G01R 19/28UGR1
.adapted for measuring in circuits having distributed constants
G01R 19/30UGR1
.Measuring the maximum or the minimum value of current or voltage reached in a time interval (G01R 19/04 takes precedence; modifications of instruments to indicate the maximum or the minimum value reached in a time interval G01R 1/40) [2, 3]
G01R 19/32UGR1
.Compensating for temperature change [2]
G01R 21/00HGRArrangements for measuring electric power or power factor (G01R 7/12 takes precedence) [4]
G01R 21/01UGR1
.in circuits having distributed constants (G01R 21/04 , G01R 21/07 , G01R 21/09 , G01R 21/12 take precedence) [2]
G01R 21/02UGR1
.by thermal methods [2]
G01R 21/04UGR2
. .in circuits having distributed constants
G01R 21/06UGR1
.by measuring current and voltage (G01R 21/08 to G01R 21/133 take precedence) [4]
G01R 21/07UGR2
. .in circuits having distributed constants (G01R 21/09 takes precedence) [2]
G01R 21/08UGR1
.by using galvanomagnetic-effect devices, e.g. Hall-effect devices (such devices per se H01L) [2]
G01R 21/09UGR2
. .in circuits having distributed constants [2]
G01R 21/10UGR1
.by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance (G01R 21/02 takes precedence) [2]
G01R 21/12UGR2
. .in circuits having distributed constants
G01R 21/127UGR1
.by using pulse modulation (G01R 21/133 takes precedence) [4]
G01R 21/133UGR1
.by using digital technique [4]
G01R 21/14UGR1
.Compensating for temperature change [2]
G01R 22/00HGRArrangements for measuring time integral of electric power or current, e.g. by electronic methods (electromechanical arrangements G01R 11/00; monitoring electric consumption of electrically-propelled vehicles B60L 3/00) [4]
G01R 22/02UGR1
.by electrolytic methods [4]
G01R 22/04UGR1
.by calorimetric methods [4]
G01R 23/00HGRArrangements for measuring frequencies; Arrangements for analysing frequency spectra (frequency discriminators H03D)
G01R 23/02UGR1
.Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage (measuring short time intervals G04F)
G01R 23/04UGR2
. .adapted for measuring in circuits having distributed constants
G01R 23/06UGR2
. .by converting frequency into an amplitude of current or voltage
G01R 23/07UGR3
. . .using response of circuits tuned on resonance, e.g. grid-drip meter [2]
G01R 23/08UGR3
. . .using response of circuits tuned off resonance
G01R 23/09UGR3
. . .using analogue integrators, e.g. capacitors establishing a mean value by balance of input signals and defined discharge signals or leakage (radiation-measuring instruments in which pulses generated by a radiation detector are integrated G01T 1/15) [2]
G01R 23/10UGR2
. .by converting frequency into a train of pulses, which are then counted
G01R 23/12UGR2
. .by converting frequency into phase shift
G01R 23/14UGR2
. .by heterodyning; by beat-frequency comparison (generation of oscillations by beating unmodulated signals of different frequencies H03B 21/00) [2]
G01R 23/15UGR2
. .Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements [3]
G01R 23/16UGR1
.Spectrum analysis; Fourier analysis
G01R 23/163UGR2
. .adapted for measuring in circuits having distributed constants [3]
G01R 23/165UGR2
. .using filters [3]
G01R 23/167UGR3
. . .with digital filters [3]
G01R 23/17UGR2
. .with optical auxiliary devices [3]
G01R 23/173UGR2
. .Wobbulating devices similar to swept panoramic receivers (panoramic receivers per se H03J 7/32) [3]
G01R 23/175UGR2
. .by delay means, e.g. tapped delay lines [3]
G01R 23/177UGR2
. .Analysis of very low frequencies [3]
G01R 23/18UGR2
. .with provision for recording frequency spectrum
G01R 23/20UGR2
. .Measurement of non-linear distortion
G01R 25/00HGRArrangements for measuring phase angle between a voltage and a current or between voltages or currents (measuring power factor G01R 21/00; measuring position of individual pulses in a pulse train G01R 29/02; phase discriminators H03D) [2]
G01R 25/02UGR1
.in circuits having distributed constants
G01R 25/04UGR1
.involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference
G01R 25/06UGR1
.employing quotient instrument
G01R 25/08UGR1
.by counting of standard pulses (measuring time intervals G04F) [2]
G01R 27/00HGRArrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
G01R 27/02UGR1
.Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant (by measuring phase angle only G01R 25/00)
G01R 27/04UGR2
. .in circuits having distributed constants
G01R 27/06UGR3
. . .Measuring reflection coefficients; Measuring standing-wave ratio
G01R 27/08UGR2
. .Measuring resistance by measuring both voltage and current
G01R 27/10UGR3
. . .using two-coil or crossed-coil instruments forming quotient
G01R 27/12UGR4
. . . .using hand generators, e.g. meggers
G01R 27/14UGR2
. .Measuring resistance by measuring current or voltage obtained from a reference source (G01R 27/16 , G01R 27/20 , G01R 27/22 take precedence)
G01R 27/16UGR2
. .Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
G01R 27/18UGR3
. . .Measuring resistance to earth
G01R 27/20UGR2
. .Measuring earth resistance; Measuring contact resistance of earth connections, e.g. plates
G01R 27/22UGR2
. .Measuring resistance of fluids (measuring vessels, electrodes therefor G01N 27/07)
G01R 27/26UGR2
. .Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants
G01R 27/28UGR1
.Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networks; Measuring transient response (in line transmission systems H04B 3/46)
G01R 27/30UGR2
. .with provision for recording characteristics, e.g. by plotting Nyquist diagram
G01R 27/32UGR2
. .in circuits having distributed constants [2]
G01R 29/00HGRArrangements for measuring or indicating electric quantities not covered by groups G01R 19/00 to G01R 27/00
G01R 29/02UGR1
.Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time, duration (of amplitude G01R 19/00; of repetition rate G01R 23/00; of phase difference of two cyclic pulse trains G01R 25/00; monitoring pattern of pulse trains H03K 5/19) [3]
G01R 29/027UGR2
. .Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values [3]
G01R 29/033UGR3
. . .giving an indication of the number of times this occurs [3]
G01R 29/04UGR1
.Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous value; Measuring peak factor, i.e. quotient of maximum value and root-mean-square value
G01R 29/06UGR1
.Measuring depth of modulation
G01R 29/08UGR1
.Measuring electromagnetic field characteristics
G01R 29/10UGR2
. .Radiation diagrams of aerials
G01R 29/12UGR1
.Measuring electrostatic fields
G01R 29/14UGR2
. .Measuring field distribution
G01R 29/16UGR1
.Measuring asymmetry of polyphase networks
G01R 29/18UGR1
.Indicating phase sequence; Indicating synchronism
G01R 29/20UGR1
.Measuring number of turns; Measuring transformation ratio or coupling factor of windings (calibrating instrument transformers G01R 35/02)
G01R 29/22UGR1
.Measuring piezo-electric properties
G01R 29/24UGR1
.Arrangements for measuring quantities of charge (electrostatic instruments G01R 5/28; indicating presence of current G01R 19/15; electrolytic meters, calorimetric meters, for measuring time integral of electric current G01R 22/02 , G01R 22/04) [2]
G01R 29/26UGR1
.Measuring noise figure; Measuring signal-to-noise ratio [2]
G01R 31/00HGRArrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (measuring leads, measuring probes G01R 1/06; indicating electrical condition of switchgear or protective devices H01H 71/04 , H01H 73/12 , H02B 11/10 , H02H 3/04; testing or measuring semiconductors or solid state devices during manufacture H01L 21/66; testing line transmission systems H04B 3/46)
G01R 31/01UGR1
.Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station (G01R 31/18 takes precedence) [6]
G01R 31/02UGR1
.Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
G01R 31/04UGR2
. .Testing connections, e.g. of plugs, of non-disconnectable joints
G01R 31/06UGR2
. .Testing of electric windings, e.g. for polarity (measuring number of turns, transformation ratio, or coupling factor G01R 29/20)
G01R 31/07UGR2
. .Testing of fuses (means for indicating condition of fuse structurally associated with the fuse H01H 85/30) [6]
G01R 31/08UGR1
.Locating faults in cables, transmission lines, or networks (emergency protective circuit arrangements H02H)
G01R 31/10UGR2
. .by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme
G01R 31/11UGR2
. .using pulse-reflection methods
G01R 31/12UGR1
.Testing dielectric strength or breakdown voltage
G01R 31/14UGR2
. .Circuits therefor
G01R 31/16UGR2
. .Construction of testing vessels; Electrodes therefor
G01R 31/18UGR2
. .Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production
G01R 31/20UGR2
. .Preparation of articles or specimens to facilitate testing
G01R 31/24UGR1
.Testing of discharge tubes (during manufacture H01J 9/42) [2]
G01R 31/25UGR2
. .Testing of vacuum tubes [2]
G01R 31/26UGR1
.Testing of individual semiconductor devices (measurement of impurity content of materials G01N) [2]
G01R 31/265UGR2
. .Contactless testing [6]
G01R 31/27UGR2
. .Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements [6]
G01R 31/28UGR1
.Testing of electronic circuits, e.g. by signal tracer (testing for short-circuits, discontinuities, leakage or incorrect line connection G01R 31/02; checking computers G06F 11/00; checking static stores for correct operation G11C 29/00)
G01R 31/30UGR2
. .Marginal testing, e.g. by varying supply voltage (marginal testing of computers G06) [2]
G01R 31/302UGR2
. .Contactless testing (non contact-making probes G01R 1/07) [5]
G01R 31/303UGR3
. . .of integrated circuits (G01R 31/305 to G01R 31/315 take precedence) [6]
G01R 31/304UGR3
. . .of printed or hybrid circuits (G01R 31/305 to G01R 31/315 take precedence) [6]
G01R 31/305UGR3
. . .using electron beams [5]
G01R 31/306UGR4
. . . .of printed or hybrid circuits [6]
G01R 31/307UGR4
. . . .of integrated circuits [6]
G01R 31/308UGR3
. . .using non-ionising electromagnetic radiation, e.g. optical radiation [5]
G01R 31/309UGR4
. . . .of printed or hybrid circuits [6]
G01R 31/311UGR4
. . . .of integrated circuits [6]
G01R 31/312UGR3
. . .by capacitive methods [5]
G01R 31/315UGR3
. . .by inductive methods [5]
G01R 31/316UGR2
. .Testing of analog circuits [6]
G01R 31/3161UGR3
. . .Marginal testing [6]
G01R 31/3163UGR3
. . .Functional testing [6]
G01R 31/3167UGR2
. .Testing of combined analog and digital circuits [6]
G01R 31/317UGR2
. .Testing of digital circuits [6]
G01R 31/3173UGR3
. . .Marginal testing [6]
G01R 31/3177UGR3
. . .Testing of logic operation, e.g. by logic analysers [6]
G01R 31/3181UGR3
. . .Functional testing (G01R 31/3177 takes precedence) [6]
G01R 31/3183UGR4
. . . .Generation of test inputs, e.g. test vectors, patterns or sequences [6]
G01R 31/3185UGR4
. . . .Reconfiguring for testing, e.g. LSSD, partitioning [6]
G01R 31/3187UGR4
. . . .Built-in tests [6]
G01R 31/319UGR4
. . . .Tester hardware, i.e. output processing circuits [6]
G01R 31/3193UGR5
. . . . .with comparison between actual response and known fault-free response [6]
G01R 31/327UGR1
.Testing of circuit interrupters, switches or circuit-breakers (structural association with switches H01H) [6]
G01R 31/333UGR2
. .Testing of the switching capacity of high-voltage circuit-breakers (means for detecting the presence of an arc or discharge in switching devices H01H 9/50 , H01H 33/26) [6]
G01R 31/34UGR1
.Testing dynamo-electric machines (testing electric windings G01R 31/06; methods or apparatus specially adapted for manufacturing, assembling, maintaining or repairing dynamo-electric machines H02K 15/00) [3]
G01R 31/36UGR1
.Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition (accumulators combined with arrangements for measuring, testing or indicating condition H01M 10/48; circuit arrangements for charging, or depolarising batteries or for supplying loads from batteries H02J 7/00) [3]
G01R 31/38UGR1
.Testing of sparking-plugs (testing non-electrical properties G01M 19/02) [6]
G01R 31/40UGR1
.Testing power supplies [6]
G01R 31/42UGR2
. .AC power supplies [6]
G01R 31/44UGR1
.Testing lamps (discharge lamps G01R 31/24; structurally associated with light source circuit arrangements for detecting lamp failure H05B 37/03) [6]
G01R 33/00HGRArrangements or instruments for measuring magnetic variables
G01R 33/02UGR1
.Measuring direction or magnitude of magnetic fields or magnetic flux (G01R 33/20 takes precedence; measuring direction or magnitude of the earth's field for navigation or surveying G01C; for prospecting, for measuring the magnetic field of the earth G01V 3/00) [4]
G01R 33/022UGR2
. .Measuring gradient [3]
G01R 33/025UGR2
. .Compensating stray fields [3]
G01R 33/028UGR2
. .Electrodynamic magnetometers [3]
G01R 33/032UGR2
. .using magneto-optic devices, e.g. Faraday [3]
G01R 33/035UGR2
. .using superconductive devices [3]
G01R 33/038UGR2
. .using permanent magnets, e.g. balances, torsion devices [3]
G01R 33/04UGR2
. .using the flux-gate principle
G01R 33/05UGR3
. . .in thin-film element [3]
G01R 33/06UGR2
. .using galvano-magnetic devices
G01R 33/07UGR3
. . .Hall-effect devices [6]
G01R 33/09UGR3
. . .Magneto-resistive devices [6]
G01R 33/10UGR2
. .Plotting field distribution
G01R 33/12UGR1
.Measuring magnetic properties of articles or specimens of solids or fluids (involving magnetic resonance G01R 33/20) [4]
G01R 33/14UGR2
. .Measuring or plotting hysteresis curves
G01R 33/16UGR2
. .Measuring susceptibility
G01R 33/18UGR2
. .Measuring magnetostrictive properties
G01R 33/20UGR1
.involving magnetic resonance (medical aspects A61B 5/055; magnetic resonance gyrometers G01C 19/60) [4, 5]
G01R 33/24UGR2
. .for measuring direction or magnitude of magnetic fields or magnetic flux [4]
G01R 33/26UGR3
. . .using optical pumping [4]
G01R 33/28UGR2
. .Details of apparatus provided for in groups G01R 33/44 to G01R 33/64 [5]
G01R 33/30UGR3
. . .Sample handling arrangements, e.g. sample cells, spinning mechanisms [5]
G01R 33/31UGR4
. . . .Temperature control thereof [6]
G01R 33/32UGR3
. . .Excitation or detection systems, e.g. using radiofrequency signals [5]
G01R 33/34UGR4
. . . .Constructional details, e.g. resonators [5]
G01R 33/341UGR5
. . . . .comprising surface coils [6]
G01R 33/3415UGR6
. . . . . .comprising arrays of sub-coils [6]
G01R 33/343UGR5
. . . . .of slotted-tube or loop-gap type [6]
G01R 33/345UGR5
. . . . .of waveguide type (G01R 33/343 takes precedence) [6]
G01R 33/36UGR4
. . . .Electrical details, e.g. matching or coupling of the coil to the receiver [5]
G01R 33/38UGR3
. . .Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field [5]
G01R 33/381UGR4
. . . .using electromagnets (electromagnets per se H01F 7/06) [6]
G01R 33/3815UGR5
. . . . .with superconducting coils, e.g. power supply therefor (superconductive magnets H01F 6/00) [6]
G01R 33/383UGR4
. . . .using permanent magnets (permanent magnets per se H01F 7/02) [6]
G01R 33/385UGR4
. . . .using gradient magnetic field coils [6]
G01R 33/387UGR4
. . . .Compensation of inhomogeneities (screening G01R 33/42) [6]
G01R 33/3873UGR5
. . . . .using ferromagnetic bodies [6]
G01R 33/3875UGR5
. . . . .using correction coil assemblies, e.g. active shimming [6]
G01R 33/389UGR4
. . . .Field stabilisation [6]
G01R 33/42UGR3
. . .Screening (screening in general H05K 9/00) [5, 6]
G01R 33/421UGR4
. . . .of main or gradient magnetic field [6]
G01R 33/422UGR4
. . . .of the radiofrequency field [6]
G01R 33/44UGR2
. .using nuclear magnetic resonance (NMR) (G01R 33/24 , G01R 33/62 take precedence) [5]
G01R 33/46UGR3
. . .NMR spectroscopy [5]
G01R 33/465UGR4
. . . .applied to biological material, e.g. in vitro testing [6]
G01R 33/48UGR3
. . .NMR imaging systems [5]
G01R 33/483UGR4
. . . .with selection of signal or spectra from particular regions of the volume, e.g. in vivo spectroscopy [6]
G01R 33/485UGR5
. . . . .based on chemical shift information [6]
G01R 33/50UGR4
. . . .based on the determination of relaxation times [5]
G01R 33/54UGR4
. . . .Signal processing systems, e.g. using pulse sequences [5]
G01R 33/56UGR5
. . . . .Image enhancement or correction, e.g. subtraction or averaging techniques [5]
G01R 33/561UGR6
. . . . . .by reduction of the scanning time, i.e. fast acquiring systems, e.g. using echo-planar pulse sequences [6]
G01R 33/563UGR6
. . . . . .of moving material, e.g. flow-contrast angiography [6]
G01R 33/565UGR6
. . . . . .Correction of image distortions, e.g. due to magnetic field inhomogeneities [6]
G01R 33/567UGR6
. . . . . .gated by physiological signals [6]
G01R 33/58UGR4
. . . .Calibration of imaging systems, e.g. using test probes [5]
G01R 33/60UGR2
. .using electron paramagnetic resonance (G01R 33/24 , G01R 33/62 take precedence) [5]
G01R 33/62UGR2
. .using double resonance (G01R 33/24 takes precedence) [5]
G01R 33/64UGR2
. .using cyclotron resonance (G01R 33/24 takes precedence) [5]
G01R 35/00HGRTesting or calibrating of apparatus covered by the preceding groups [2]
G01R 35/02UGR1
.of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
G01R 35/04UGR1
.of instruments for measuring time integral of power or current
G01R 35/06UGR2
. .by stroboscopic methods