IPC-Stelle: G01Q [Version 2017.01]

SymbolTypTitel
GSKPHYSICS
G01USKINSTRUMENTS
G01KLMEASURING; TESTING
G01QUKLSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] [2010.01]
G01Q 10/00HGRScanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe [2010.01]
G01Q 10/02UGR1
.Coarse scanning or positioning [2010.01]
G01Q 10/04UGR1
.Fine scanning or positioning [2010.01]
G01Q 10/06UGR2
. .Circuits or algorithms therefor [2010.01]
G01Q 20/00HGRMonitoring the movement or position of the probe [2010.01]
G01Q 20/02UGR1
.by optical means [2010.01]
G01Q 20/04UGR1
.Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge [2010.01]
G01Q 30/00HGRAuxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices [2010.01]
G01Q 30/02UGR1
.Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope [2010.01]
G01Q 30/04UGR1
.Display or data processing devices [2010.01]
G01Q 30/06UGR2
. .for error compensation [2010.01]
G01Q 30/08UGR1
.Means for establishing or regulating a desired environmental condition within a sample chamber [2010.01]
G01Q 30/10UGR2
. .Thermal environment [2010.01]
G01Q 30/12UGR2
. .Fluid environment [2010.01]
G01Q 30/14UGR3
. . .Liquid environment [2010.01]
G01Q 30/16UGR2
. .Vacuum environment [2010.01]
G01Q 30/18UGR1
.Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields [2010.01]
G01Q 30/20UGR1
.Sample handling devices or methods [2010.01]
G01Q 40/00HGRCalibration, e.g. of probes [2010.01]
G01Q 40/02UGR1
.Calibration standards or methods of fabrication thereof [2010.01]
G01Q 60/00HGRParticular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof [2010.01]
G01Q 60/02UGR1
.Multiple-type SPM, i.e. involving two or more SPM techniques [2010.01]
G01Q 60/04UGR2
. .STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy] [2010.01]
G01Q 60/06UGR2
. .SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy] [2010.01]
G01Q 60/08UGR2
. .MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy] [2010.01]
G01Q 60/10UGR1
.STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes [2010.01]
G01Q 60/12UGR2
. .STS [Scanning Tunnelling Spectroscopy] [2010.01]
G01Q 60/14UGR2
. .STP [Scanning Tunnelling Potentiometry] [2010.01]
G01Q 60/16UGR2
. .Probes, their manufacture or their related instrumentation, e.g. holders [2010.01]
G01Q 60/18UGR1
.SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes [2010.01]
G01Q 60/20UGR2
. .Fluorescence [2010.01]
G01Q 60/22UGR2
. .Probes, their manufacture or their related instrumentation, e.g. holders [2010.01]
G01Q 60/24UGR1
.AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes [2010.01]
G01Q 60/26UGR2
. .Friction force microscopy [2010.01]
G01Q 60/28UGR2
. .Adhesion force microscopy [2010.01]
G01Q 60/30UGR2
. .Scanning potential microscopy [2010.01]
G01Q 60/32UGR2
. .AC mode [2010.01]
G01Q 60/34UGR3
. . .Tapping mode [2010.01]
G01Q 60/36UGR2
. .DC mode [2010.01]
G01Q 60/38UGR2
. .Probes, their manufacture or their related instrumentation, e.g. holders [2010.01]
G01Q 60/40UGR3
. . .Conductive probes [2010.01]
G01Q 60/42UGR3
. . .Functionalisation [2010.01]
G01Q 60/44UGR1
.SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes [2010.01]
G01Q 60/46UGR1
.SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes [2010.01]
G01Q 60/48UGR2
. .Probes, their manufacture or their related instrumentation, e.g. holders [2010.01]
G01Q 60/50UGR1
.MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes [2010.01]
G01Q 60/52UGR2
. .Resonance [2010.01]
G01Q 60/54UGR2
. .Probes, their manufacture or their related instrumentation, e.g. holders [2010.01]
G01Q 60/56UGR3
. . .Probes with magnetic coating [2010.01]
G01Q 60/58UGR1
.SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes [2010.01]
G01Q 60/60UGR1
.SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes [2010.01]
G01Q 70/00HGRGeneral aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q 60/00 [2010.01]
G01Q 70/02UGR1
.Probe holders [2010.01]
G01Q 70/04UGR2
. .with compensation for temperature or vibration induced errors [2010.01]
G01Q 70/06UGR1
.Probe tip arrays [2010.01]
G01Q 70/08UGR1
.Probe characteristics [2010.01]
G01Q 70/10UGR2
. .Shape or taper [2010.01]
G01Q 70/12UGR3
. . .Nanotube tips [2010.01]
G01Q 70/14UGR2
. .Particular materials [2010.01]
G01Q 70/16UGR1
.Probe manufacture [2010.01]
G01Q 70/18UGR2
. .Functionalisation [2010.01]
G01Q 80/00HGRApplications, other than SPM, of scanning-probe techniques (manufacture or treatment of microstructures B81C; manufacture or treatment of nanostructures B82B 3/00; recording or reproducing information using near-field interaction G11B 9/12, G11B 11/24 or G11B 13/08) [2010.01]
G01Q 90/00HGRScanning-probe techniques or apparatus not otherwise provided for [2010.01]