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Symbol IPC-Stellen auswählen Titel
A
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SECTION A — HUMAN NECESSITIES
B
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SECTION B — PERFORMING OPERATIONSTRANSPORTING
C
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SECTION C — CHEMISTRYMETALLURGY
D
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SECTION D — TEXTILESPAPER
E
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SECTION E — FIXED CONSTRUCTIONS
F
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SECTION F — MECHANICAL ENGINEERINGLIGHTINGHEATINGWEAPONSBLASTING
G
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SECTION G — PHYSICS
H
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SECTION H — ELECTRICITY
H01
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BASIC ELECTRIC ELEMENTS
H01B
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CABLESCONDUCTORSINSULATORSSELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING, OR DIELECTRIC PROPERTIES (selection for magnetic properties H01F 1/00; waveguides H01P; installation of cables or lines, or of combined optical and electric, cables or lines H02G)
H01C
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RESISTORS
H01F
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MAGNETSINDUCTANCESTRANSFORMERSSELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES (ceramics based on ferrites C04B 35/26; alloys C22C; thermomagnetic devices H01L 37/00; loudspeakers, microphones, gramophone pick-ups or like acoustic electromechanical transducers H04R) [2]
H01G
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CAPACITORSCAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE (selection of specified materials as dielectric H01B 3/00; capacitors with potential-jump or surface barrier H01L 29/00)
H01H
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ELECTRIC SWITCHESRELAYSSELECTORSEMERGENCY PROTECTIVE DEVICES (contact cables H01B 7/10; electrolytic self-interrupters H01G 9/18; emergency protective circuit arrangements H02H; switching by electronic means without contact-making H03K 17/00)
H01J
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ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)
H01K
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ELECTRIC INCANDESCENT LAMPS (details or apparatus or processes for manufacture applicable to both discharge devices and incandescent lamps H01J; light sources using a combination of incandescent and other types of light generation H01J 61/96, H05B 35/00; circuits therefor H05B)
H01L
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SEMICONDUCTOR DEVICESELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR (use of semiconductor devices for measuring G01; resistors in general H01C; magnets, inductors, transformers H01F; capacitors in general H01G; electrolytic devices H01G 9/00; batteries, accumulators H01M; waveguides, resonators, or lines of the waveguide type H01P; line connectors, current collectors H01R; stimulated-emission devices H01S; electromechanical resonators H03H; loudspeakers, microphones, gramophone pick-ups or like acoustic electromechanical transducers H04R; electric light sources in general H05B; printed circuits, hybrid circuits, casings or constructional details of electrical apparatus, manufacture of assemblages of electrical components H05K; use of semiconductor devices in circuits having a particular application, see the subclass for the application) [2]
H01L 21/00
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Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof [2, 2006.01]
H01L 23/00
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Details of semiconductor or other solid state devices (H01L 25/00 takes precedence) [2, 5]
H01L 25/00
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Assemblies consisting of a plurality of individual semiconductor or other solid state devices (devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00; assemblies of photoelectronic cells H01L 31/042) [2, 5]
H01L 27/00
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Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (details thereof H01L 23/00, H01L 29/00-H01L 51/00; assemblies consisting of a plurality of individual solid state devices H01L 25/00) [2, 2006.01]
H01L 29/00
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Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrierCapacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN-junction depletion layer or carrier concentration layerDetails of semiconductor bodies or of electrodes thereof (H01L 31/00-H01L 47/00, H01L 51/05 take precedence; details other than of semiconductor bodies or of electrodes thereof H01L 23/00; devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00) [2, 6]
H01L 31/00
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Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiationProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereofDetails thereof (H01L 51/42 takes precedence; devices consisting of a plurality of solid state components formed in, or on, a common substrate, other than combinations of radiation-sensitive components with one or more electric light sources, H01L 27/00) [2, 6, 2006.01]
H01L 31/02
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Details [2]
H01L 31/0203
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. . ContainersEncapsulations [5]
H01L 31/0216
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. . Coatings [5]
H01L 31/0224
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. . Electrodes [5]
H01L 31/0232
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. . Optical elements or arrangements associated with the device [5]
H01L 31/0236
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. . Special surface textures [5]
H01L 31/024
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. . Arrangements for cooling, heating, ventilating or temperature compensation [5]
H01L 31/0248
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characterised by their semiconductor bodies [5]
H01L 31/0256
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. . characterised by the material [5]
H01L 31/0264
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. . . Inorganic materials [5]
H01L 31/0272
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. . . . Selenium or tellurium [5]
H01L 31/028
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. . . . including, apart from doping material or other impurities, only elements of the fourth group of the Periodic System [5]
H01L 31/0288
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. . . . . characterised by the doping material [5]
H01L 31/0296
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. . . . including, apart from doping material or other impurities, only AIIBVI compounds, e.g. CdS, ZnS, HgCdTe [5]
H01L 31/0304
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. . . . including, apart from doping materials or other impurities, only AIIIBV compounds [5]
H01L 31/0312
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. . . . including, apart from doping materials or other impurities, only AIVBIV compounds, e.g. SiC [5]
H01L 31/032
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. . . . including, apart from doping materials or other impurities, only compounds not provided for in groups H01L 31/0272-H01L 31/0312 [5]
H01L 31/0328
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. . . . including, apart from doping materials or other impurities, semiconductor materials provided for in two or more of groups H01L 31/0272-H01L 31/032 [5]
H01L 31/0336
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. . . . . in different semiconductor regions, e.g. Cu2X/CdX hetero-junctions, X being an element of the sixth group of the Periodic System [5]
H01L 31/0352
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. . characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions [5]
H01L 31/036
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. . characterised by their crystalline structure or particular orientation of the crystalline planes [5]
H01L 31/0368
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. . . including polycrystalline semiconductors (H01L 31/0392 takes precedence) [5]
H01L 31/0376
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. . . including amorphous semiconductors (H01L 31/0392 takes precedence) [5]
H01L 31/0384
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. . . including other non-monocrystalline materials, e.g. semiconductor particles embedded in an insulating material (H01L 31/0392 takes precedence) [5]
H01L 31/0392
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. . . including thin films deposited on metallic or insulating substrates [5]
H01L 31/04
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adapted as conversion devices [2]
H01L 31/042
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. . including a panel or array of photoelectric cells, e.g. solar cells [5]
H01L 31/045
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. . . collapsible or foldable [5]
H01L 31/048
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. . . encapsulated or with housing [5]
H01L 31/05
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. . . characterised by special interconnection means [5]
H01L 31/052
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. . . with cooling, light-reflecting or light- concentrating means [5]
H01L 31/055
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. . . . where light is absorbed and re-emitted at a different wavelength by the concentrator, e.g. by using luminescent material [5]
H01L 31/058
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. . . including means to utilise heat energy, e.g. hybrid systems, or a supplementary source of electric energy [5]
H01L 31/06
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. . characterised by at least one potential-jump barrier or surface barrier [2]
H01L 31/062
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. . . the potential barriers being only of the metal-insulator-semiconductor type [5]
H01L 31/065
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. . . the potential barriers being only of the graded gap type [5]
H01L 31/068
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. . . the potential barriers being only of the PN homojunction type [5]
H01L 31/07
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. . . the potential barriers being only of the Schottky type [5]
H01L 31/072
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. . . the potential barriers being only of the PN heterojunction type [5]
H01L 31/075
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. . . the potential barriers being only of the PIN type [5]
H01L 31/078
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. . . including potential barriers provided for in two or more of groups H01L 31/062-H01L 31/075 [5]
H01L 31/08
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in which radiation controls flow of current through the device, e.g. photoresistors [2]
H01L 31/09
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. . Devices sensitive to infra-red, visible or ultra- violet radiation (H01L 31/101 takes precedence) [5]
H01L 31/10
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. . characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors [2]
H01L 31/101
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. . . Devices sensitive to infra-red, visible or ultra-violet radiation [5]
H01L 31/102
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. . . . characterised by only one potential barrier or surface barrier [5]
H01L 31/103
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. . . . . the potential barrier being of the PN homojunction type [5]
H01L 31/105
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. . . . . the potential barrier being of the PIN type [5]
H01L 31/107
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. . . . . the potential barrier working in avalanche mode, e.g. avalanche photodiode [5]
H01L 31/108
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. . . . . the potential barrier being of the Schottky type [5]
H01L 31/109
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. . . . . the potential barrier being of the PN heterojunction type [5]
H01L 31/11
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. . . . characterised by two potential barriers or surface barriers, e.g. bipolar phototransistor [5]
H01L 31/111
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. . . . characterised by at least three potential barriers, e.g. photothyristor [5]
H01L 31/112
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. . . . characterised by field-effect operation, e.g. junction field-effect photo- transistor [5]
H01L 31/113
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. . . . . being of the conductor-insulator- semiconductor type, e.g. metal- insulator-semiconductor field-effect transistor [5]
H01L 31/115
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. . . Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation [5]
H01L 31/117
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. . . . of the bulk effect radiation detector type, e.g. Ge-Li compensated PIN gamma-ray detectors [5]
H01L 31/118
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. . . . of the surface barrier or shallow PN junction detector type, e.g. surface barrier alpha-particle detectors [5]
H01L 31/119
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. . . . characterised by field-effect operation, e.g. MIS type detectors [5]
H01L 31/12
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structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto (electroluminescent light sources per seH05B 33/00) [2, 5]
H01L 31/14
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. . the light source or sources being controlled by the semiconductor device sensitive to radiation, e.g. image converters, image amplifiers, image storage devices [2]
H01L 31/147
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. . . the light sources and the devices sensitive to radiation all being semiconductor devices characterised by at least one potential or surface barrier [5]
H01L 31/153
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. . . . formed in, or on, a common substrate [5]
H01L 31/16
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. . the semiconductor device sensitive to radiation being controlled by the light source or sources [2]
H01L 31/167
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. . . the light sources and the devices sensitive to radiation all being semiconductor devices characterised by at least one potential or surface barrier [5]
H01L 31/173
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. . . . formed in, or on, a common substrate [5]
H01L 31/18
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Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof [2]
H01L 31/20
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. . such devices or parts thereof comprising amorphous semiconductor material [5]
H01L 33/00
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Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emissionProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereofDetails thereof (H01L 51/50 takes precedence; devices consisting of a plurality of semiconductor components formed in or on a common substrate and including semiconductor components with at least one potential-jump barrier or surface barrier, specially adapted for light emission H01L 27/15; semiconductor lasers H01S 5/00) [2, 2006.01, 2010.01]
H01L 35/00
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Thermoelectric devices comprising a junction of dissimilar materials, i.e. exhibiting Seebeck or Peltier effect with or without other thermoelectric effects or thermomagnetic effectsProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereofDetails thereof (devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00) [2]
H01L 37/00
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Thermoelectric devices without a junction of dissimilar materialsThermomagnetic devices, e.g. using Nernst-Ettinghausen effectProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof (devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00) [2]
H01L 39/00
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Devices using superconductivity or hyperconductivityProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof (devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00; superconductors characterised by the ceramic-forming technique or the ceramic composition C04B 35/00; superconductive or hyperconductive conductors, cables, or transmission lines H01B 12/00; superconductive coils or windings H01F; amplifiers using superconductivity H03F 19/00) [2, 4]
H01L 41/00
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Piezo-electric elements in generalElectrostrictive elements in generalMagnetostrictive elements in generalProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereofDetails thereof (devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00) [2]
H01L 43/00
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Devices using galvano-magnetic or similar magnetic effectsProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof (devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00) [2]
H01L 45/00
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Solid state devices specially adapted for rectifying, amplifying, oscillating, or switching without a potential-jump barrier or surface barrier, e.g. dielectric triodesOvshinsky-effect devicesProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof (devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00; devices using superconductivity or hyperconductivity H01L 39/00; piezo-electric elements H01L 41/00; bulk negative resistance effect devices H01L 47/00) [2]
H01L 47/00
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Bulk negative resistance effect devices, e.g. Gunn-effect devicesProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof (devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00) [2]
H01L 49/00
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Solid state devices not provided for in groups H01L 27/00-H01L 47/00 and H01L 51/00 and not provided for in any other subclassProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof [2, 2006.01]
H01L 51/00
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Solid state devices using organic materials as the active part, or using a combination of organic materials with other materials as the active partProcesses or apparatus specially adapted for the manufacture or treatment of such devices, or of parts thereof (devices consisting of a plurality of components formed in or on a common substrate H01L 27/28; thermoelectric devices using organic material H01L 35/00, H01L 37/00; piezo-electric, electrostrictive or magnetostrictive elements using organic material H01L 41/00) [6, 2006.01]
H01M
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PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY (electrochemical processes or apparatus in general C25; semiconductor or other solid state devices for converting light or heat into electrical energy H01L, e.g. H01L 31/00, H01L 35/00, H01L 37/00) [2]
H01P
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WAVEGUIDESRESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE (operating at optical frequencies G02B)
H01Q
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AERIALS (microwave radiators for near-field therapeutic treatment A61N 5/04; apparatus for testing aerials or for measuring aerial characteristics G01R; waveguides H01P; radiators or aerials for microwave heating H05B 6/72)
H01R
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ELECTRICALLY-CONDUCTIVE CONNECTIONSSTRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTSCOUPLING DEVICESCURRENT COLLECTORS (switches, fuses H01H; coupling devices of the waveguide type H01P 5/00; switching arrangements for the supply or distribution of electric power H02B; installations of electric cables or lines, or of combined optical and electric cables or lines, or of auxiliary apparatus H02G; printed means for providing electric connections to or between printed circuits H05K)
H01S
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DEVICES USING STIMULATED EMISSION
H01T
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SPARK GAPSOVERVOLTAGE ARRESTERS USING SPARK GAPSSPARKING PLUGSCORONA DEVICESGENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES (working of metal by the action of a high concentration of electric current B23H; welding, e.g. arc welding, electron beam welding or electrolytic welding, B23K; gas-filled discharge tubes with solid cathode H01J 17/00; electric arc lamps H05B 31/00)
H02
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GENERATION, CONVERSION, OR DISTRIBUTION OF ELECTRIC POWER
H03
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BASIC ELECTRONIC CIRCUITRY
H04
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ELECTRIC COMMUNICATION TECHNIQUE
H05
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ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
H99
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SUBJECT MATTER NOT OTHERWISE PROVIDED FOR IN THIS SECTION [2006.01]

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