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A
Hierarchie anzeigen
HUMAN NECESSITIES
B
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PERFORMING OPERATIONSTRANSPORTING
C
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CHEMISTRYMETALLURGY
D
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TEXTILESPAPER
E
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FIXED CONSTRUCTIONS
F
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MECHANICAL ENGINEERINGLIGHTINGHEATINGWEAPONSBLASTING
G
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PHYSICS
H
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ELECTRICITY
H01
Hierarchie anzeigen
ELECTRIC ELEMENTS
H01B
Hierarchie anzeigen
CABLESCONDUCTORSINSULATORSSELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES (selection for magnetic properties H01F 1/00; waveguides H01P)
H01C
Hierarchie anzeigen
RESISTORS
H01F
Hierarchie anzeigen
MAGNETSINDUCTANCESTRANSFORMERSSELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES [2]
H01G
Hierarchie anzeigen
CAPACITORSCAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE (selection of specified materials as dielectric H01B 3/00; capacitors having potential barriers H01L 29/00)
H01H
Hierarchie anzeigen
ELECTRIC SWITCHESRELAYSSELECTORSEMERGENCY PROTECTIVE DEVICES (contact cables H01B 7/10;  electrolytic self-interrupters H01G 9/18;  emergency protective circuit arrangements H02H;  switching by electronic means without contact-making H03K 17/00)
H01J
Hierarchie anzeigen
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)
H01K
Hierarchie anzeigen
ELECTRIC INCANDESCENT LAMPS (details, apparatus or processes for manufacture applicable to both discharge devices and incandescent lamps H01J;  light sources using a combination of incandescent and other types of light generation H01J 61/96, H05B 35/00)
H01L
Hierarchie anzeigen
SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10 (use of semiconductor devices for measuring G01;  resistors in general H01C;  magnets, inductors or transformers H01F;  capacitors in general H01G;  electrolytic devices H01G 9/00;  batteries or accumulators H01M;  waveguides, resonators or lines of the waveguide type H01P;  line connectors or current collectors H01R;  stimulated-emission devices H01S;  electromechanical resonators H03H;  loudspeakers, microphones, gramophone pick-ups or like acoustic electromechanical transducers H04R;  electric light sources in general H05B;  printed circuits, hybrid circuits, casings or constructional details of electrical apparatus, manufacture of assemblages of electrical components H05K;  use of semiconductor devices in circuits having a particular application, see the subclass for the application) [2]
H01L 21/00
Hierarchie anzeigen
Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid-state devices, or of parts thereof [2, 2006.01]
H01L 21/02
Hierarchie anzeigen
Manufacture or treatment of semiconductor devices or of parts thereof [2, 2006.01]
H01L 21/027
Hierarchie anzeigen
. . Making masks on semiconductor bodies for further photolithographic processing, not provided for in group H01L 21/18 or H01L 21/34 [5, 2006.01]
H01L 21/033
Hierarchie anzeigen
. . . comprising inorganic layers [5, 2006.01]
H01L 21/04
Hierarchie anzeigen
. . the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer [2, 2006.01]
H01L 21/06
Hierarchie anzeigen
. . . the devices having semiconductor bodies comprising selenium or tellurium in uncombined form other than as impurities in semiconductor bodies of other materials [2, 2006.01]
H01L 21/08
Hierarchie anzeigen
. . . . Preparation of the foundation plate [2, 2006.01]
H01L 21/10
Hierarchie anzeigen
. . . . Preliminary treatment of the selenium or tellurium, its application to the foundation plate, or the subsequent treatment of the combination [2, 2006.01]
H01L 21/103
Hierarchie anzeigen
. . . . . Conversion of the selenium or tellurium to the conductive state [2, 2006.01]
H01L 21/105
Hierarchie anzeigen
. . . . . Treatment of the surface of the selenium or tellurium layer after having been made conductive [2, 2006.01]
H01L 21/108
Hierarchie anzeigen
. . . . . Provision of discrete insulating layers, i.e. non-genetic barrier layers [2, 2006.01]
H01L 21/12
Hierarchie anzeigen
. . . . Application of an electrode to the exposed surface of the selenium or tellurium after the selenium or tellurium has been applied to the foundation plate [2, 2006.01]
H01L 21/14
Hierarchie anzeigen
. . . . Treatment of the complete device, e.g. by electroforming to form a barrier [2, 2006.01]
H01L 21/145
Hierarchie anzeigen
. . . . . Ageing [2, 2006.01]
H01L 21/16
Hierarchie anzeigen
. . . the devices having semiconductor bodies comprising cuprous oxide or cuprous iodide [2, 2006.01]
H01L 21/18
Hierarchie anzeigen
. . . the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials [2, 6, 7, 2006.01]
H01L 21/20
Hierarchie anzeigen
. . . . Deposition of semiconductor materials on a substrate, e.g. epitaxial growth [2, 2006.01]
H01L 21/203
Hierarchie anzeigen
. . . . . using physical deposition, e.g. vacuum deposition, sputtering [2, 2006.01]
H01L 21/205
Hierarchie anzeigen
. . . . . using reduction or decomposition of a gaseous compound yielding a solid condensate, i.e. chemical deposition [2, 2006.01]
H01L 21/208
Hierarchie anzeigen
. . . . . using liquid deposition [2, 2006.01]
H01L 21/22
Hierarchie anzeigen
. . . . Diffusion of impurity materials, e.g. doping materials, electrode materials, into, or out of, a semiconductor body, or between semiconductor regionsRedistribution of impurity materials, e.g. without introduction or removal of further dopant [2, 2006.01]
H01L 21/223
Hierarchie anzeigen
. . . . . using diffusion into, or out of, a solid from or into a gaseous phase [2, 2006.01]
H01L 21/225
Hierarchie anzeigen
. . . . . using diffusion into, or out of, a solid from or into a solid phase, e.g. a doped oxide layer [2, 2006.01]
H01L 21/228
Hierarchie anzeigen
. . . . . using diffusion into, or out of, a solid from or into a liquid phase, e.g. alloy diffusion processes [2, 2006.01]
H01L 21/24
Hierarchie anzeigen
. . . . Alloying of impurity materials, e.g. doping materials, electrode materials, with a semiconductor body [2, 2006.01]
H01L 21/26
Hierarchie anzeigen
. . . . Bombardment with wave or particle radiation [2, 2006.01]
H01L 21/261
Hierarchie anzeigen
. . . . . to produce a nuclear reaction transmuting chemical elements [6, 2006.01]
H01L 21/263
Hierarchie anzeigen
. . . . . with high-energy radiation (H01L 21/261 takes precedence) [2, 6, 2006.01]
H01L 21/265
Hierarchie anzeigen
. . . . . . producing ion implantation [2, 2006.01]
H01L 21/266
Hierarchie anzeigen
. . . . . . . using masks [5, 2006.01]
H01L 21/268
Hierarchie anzeigen
. . . . . . using electromagnetic radiation, e.g. laser radiation [2, 2006.01]
H01L 21/28
Hierarchie anzeigen
. . . . Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L 21/20-H01L 21/268 [2, 2006.01]
H01L 21/283
Hierarchie anzeigen
. . . . . Deposition of conductive or insulating materials for electrodes [2, 2006.01]
H01L 21/285
Hierarchie anzeigen
. . . . . . from a gas or vapour, e.g. condensation [2, 2006.01]
H01L 21/288
Hierarchie anzeigen
. . . . . . from a liquid, e.g. electrolytic deposition [2, 2006.01]
H01L 21/30
Hierarchie anzeigen
. . . . Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L 21/20-H01L 21/26 (manufacture of electrodes thereon H01L 21/28) [2, 2006.01]
H01L 21/301
Hierarchie anzeigen
. . . . . to subdivide a semiconductor body into separate parts, e.g. making partitions (cutting H01L 21/304) [6, 2006.01]
H01L 21/302
Hierarchie anzeigen
. . . . . to change the physical characteristics of their surfaces, or to change their shape, e.g. etching, polishing, cutting [2, 2006.01]
H01L 21/304
Hierarchie anzeigen
. . . . . . Mechanical treatment, e.g. grinding, polishing, cutting [2, 2006.01]
H01L 21/306
Hierarchie anzeigen
. . . . . . Chemical or electrical treatment, e.g. electrolytic etching (to form insulating layers H01L 21/31; after-treatment of insulating layers H01L 21/3105) [2, 2006.01]
H01L 21/3063
Hierarchie anzeigen
. . . . . . . Electrolytic etching [6, 2006.01]
H01L 21/3065
Hierarchie anzeigen
. . . . . . . Plasma etchingReactive-ion etching [6, 2006.01]
H01L 21/308
Hierarchie anzeigen
. . . . . . . using masks (H01L 21/3063, H01L 21/3065, take precedence) [2, 6, 2006.01]
H01L 21/31
Hierarchie anzeigen
. . . . . to form insulating layers thereon, e.g. for masking or by using photolithographic techniques (encapsulating layers H01L 21/56)After-treatment of these layersSelection of materials for these layers [2, 5, 2006.01]
H01L 21/3105
Hierarchie anzeigen
. . . . . . After-treatment [5, 2006.01]
H01L 21/311
Hierarchie anzeigen
. . . . . . . Etching the insulating layers [5, 2006.01]
H01L 21/3115
Hierarchie anzeigen
. . . . . . . Doping the insulating layers [5, 2006.01]
H01L 21/312
Hierarchie anzeigen
. . . . . . Organic layers, e.g. photoresist (H01L 21/3105, H01L 21/32 take precedence) [2, 5, 2006.01]
H01L 21/314
Hierarchie anzeigen
. . . . . . Inorganic layers (H01L 21/3105, H01L 21/32 take precedence) [2, 5, 2006.01]
H01L 21/316
Hierarchie anzeigen
. . . . . . . composed of oxides or glassy oxides or oxide-based glass [2, 2006.01]
H01L 21/318
Hierarchie anzeigen
. . . . . . . composed of nitrides [2, 2006.01]
H01L 21/32
Hierarchie anzeigen
. . . . . . using masks [2, 5, 2006.01]
H01L 21/3205
Hierarchie anzeigen
. . . . . . Deposition of non-insulating-, e.g. conductive- or resistive-, layers, on insulating layersAfter-treatment of these layers (manufacture of electrodes H01L 21/28) [5, 2006.01]
H01L 21/321
Hierarchie anzeigen
. . . . . . . After-treatment [5, 2006.01]
H01L 21/3213
Hierarchie anzeigen
. . . . . . . . Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer [6, 2006.01]
H01L 21/3215
Hierarchie anzeigen
. . . . . . . . Doping the layers [5, 2006.01]
H01L 21/322
Hierarchie anzeigen
. . . . . to modify their internal properties, e.g. to produce internal imperfections [2, 2006.01]
H01L 21/324
Hierarchie anzeigen
. . . . . Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering  (H01L 21/20-H01L 21/288, H01L 21/302-H01L 21/322 take precedence) [2, 2006.01]
H01L 21/326
Hierarchie anzeigen
. . . . . Application of electric currents or fields, e.g. for electroforming (H01L 21/20-H01L 21/288, H01L 21/302-H01L 21/324 take precedence) [2, 2006.01]
H01L 21/328
Hierarchie anzeigen
. . . . Multistep processes for the manufacture of devices of the bipolar type, e.g. diodes, transistors, thyristors [5, 2006.01]
H01L 21/329
Hierarchie anzeigen
. . . . . the devices comprising one or two electrodes, e.g. diodes [5, 2006.01]
H01L 21/33
Hierarchie anzeigen
. . . . . the devices comprising three or more electrodes [5, 2006.01]
H01L 21/331
Hierarchie anzeigen
. . . . . . Transistors [5, 2006.01]
H01L 21/332
Hierarchie anzeigen
. . . . . . Thyristors [5, 2006.01]
H01L 21/334
Hierarchie anzeigen
. . . . Multistep processes for the manufacture of devices of the unipolar type [5, 2006.01]
H01L 21/335
Hierarchie anzeigen
. . . . . Field-effect transistors [5, 2006.01]
H01L 21/336
Hierarchie anzeigen
. . . . . . with an insulated gate [5, 2006.01]
H01L 21/337
Hierarchie anzeigen
. . . . . . with a PN junction gate [5, 2006.01]
H01L 21/338
Hierarchie anzeigen
. . . . . . with a Schottky gate [5, 2006.01]
H01L 21/339
Hierarchie anzeigen
. . . . . Charge transfer devices [5, 6, 2006.01]
H01L 21/34
Hierarchie anzeigen
. . . the devices having semiconductor bodies not provided for in groups H01L 21/06, H01L 21/16, and H01L 21/18 with or without impurities, e.g. doping materials [2, 2006.01]
H01L 21/36
Hierarchie anzeigen
. . . . Deposition of semiconductor materials on a substrate, e.g. epitaxial growth [2, 2006.01]
H01L 21/363
Hierarchie anzeigen
. . . . . using physical deposition, e.g. vacuum deposition, sputtering [2, 2006.01]
H01L 21/365
Hierarchie anzeigen
. . . . . using reduction or decomposition of a gaseous compound yielding a solid condensate, i.e. chemical deposition [2, 2006.01]
H01L 21/368
Hierarchie anzeigen
. . . . . using liquid deposition [2, 2006.01]
H01L 21/38
Hierarchie anzeigen
. . . . Diffusion of impurity materials, e.g. doping materials, electrode materials, into, or out of, a semiconductor body, or between semiconductor regions [2, 2006.01]
H01L 21/383
Hierarchie anzeigen
. . . . . using diffusion into, or out of, a solid from or into a gaseous phase [2, 2006.01]
H01L 21/385
Hierarchie anzeigen
. . . . . using diffusion into, or out of, a solid from or into a solid phase, e.g. a doped oxide layer [2, 2006.01]
H01L 21/388
Hierarchie anzeigen
. . . . . using diffusion into, or out of, a solid from or into a liquid phase, e.g. alloy diffusion processes [2, 2006.01]
H01L 21/40
Hierarchie anzeigen
. . . . Alloying of impurity materials, e.g. doping materials, electrode materials, with a semiconductor body [2, 2006.01]
H01L 21/42
Hierarchie anzeigen
. . . . Bombardment with radiation [2, 2006.01]
H01L 21/423
Hierarchie anzeigen
. . . . . with high-energy radiation [2, 2006.01]
H01L 21/425
Hierarchie anzeigen
. . . . . . producing ion implantation [2, 2006.01]
H01L 21/426
Hierarchie anzeigen
. . . . . . . using masks [5, 2006.01]
H01L 21/428
Hierarchie anzeigen
. . . . . . using electromagnetic radiation, e.g. laser radiation [2, 2006.01]
H01L 21/44
Hierarchie anzeigen
. . . . Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L 21/36-H01L 21/428 [2, 2006.01]
H01L 21/441
Hierarchie anzeigen
. . . . . Deposition of conductive or insulating materials for electrodes [2, 2006.01]
H01L 21/443
Hierarchie anzeigen
. . . . . . from a gas or vapour, e.g. condensation [2, 2006.01]
H01L 21/445
Hierarchie anzeigen
. . . . . . from a liquid, e.g. electrolytic deposition [2, 2006.01]
H01L 21/447
Hierarchie anzeigen
. . . . . involving the application of pressure, e.g. thermo-compression bonding (H01L 21/607 takes precedence) [2, 2006.01]
H01L 21/449
Hierarchie anzeigen
. . . . . involving the application of mechanical vibrations, e.g. ultrasonic vibrations [2, 2006.01]
H01L 21/46
Hierarchie anzeigen
. . . . Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L 21/36-H01L 21/428 (manufacture of electrodes thereon H01L 21/44) [2, 2006.01]
H01L 21/461
Hierarchie anzeigen
. . . . . to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting [2, 2006.01]
H01L 21/463
Hierarchie anzeigen
. . . . . . Mechanical treatment, e.g. grinding, ultrasonic treatment [2, 2006.01]
H01L 21/465
Hierarchie anzeigen
. . . . . . Chemical or electrical treatment, e.g. electrolytic etching (to form insulating layers H01L 21/469) [2, 2006.01]
H01L 21/467
Hierarchie anzeigen
. . . . . . . using masks [2, 2006.01]
H01L 21/469
Hierarchie anzeigen
. . . . . . to form insulating layers thereon, e.g. for masking or by using photolithographic techniques (encapsulating layers H01L 21/56)After-treatment of these layers [2, 5, 2006.01]
H01L 21/47
Hierarchie anzeigen
. . . . . . . Organic layers, e.g. photoresist (H01L 21/475, H01L 21/4757 take precedence) [2, 5, 2006.01]
H01L 21/471
Hierarchie anzeigen
. . . . . . . Inorganic layers (H01L 21/475, H01L 21/4757 take precedence) [2, 5, 2006.01]
H01L 21/473
Hierarchie anzeigen
. . . . . . . . composed of oxides or glassy oxides or oxide-based glass [2, 2006.01]
H01L 21/475
Hierarchie anzeigen
. . . . . . . using masks [2, 5, 2006.01]
H01L 21/4757
Hierarchie anzeigen
. . . . . . . After-treatment [5, 2006.01]
H01L 21/4763
Hierarchie anzeigen
. . . . . . Deposition of non-insulating-, e.g. conductive-, resistive-, layers on insulating layersAfter-treatment of these layers (manufacture of electrodes H01L 21/28) [5, 2006.01]
H01L 21/477
Hierarchie anzeigen
. . . . . Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering (H01L 21/36-H01L 21/449, H01L 21/461-H01L 21/475 take precedence) [2, 2006.01]
H01L 21/479
Hierarchie anzeigen
. . . . . Application of electric currents or fields, e.g. for electroforming (H01L 21/36-H01L 21/449, H01L 21/461-H01L 21/477 take precedence) [2, 2006.01]
H01L 21/48
Hierarchie anzeigen
. . . Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L 21/06-H01L 21/326 [2, 2006.01]
H01L 21/50
Hierarchie anzeigen
. . . Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L 21/06-H01L 21/326 [2, 2006.01]
H01L 21/52
Hierarchie anzeigen
. . . . Mounting semiconductor bodies in containers [2, 2006.01]
H01L 21/54
Hierarchie anzeigen
. . . . Providing fillings in containers, e.g. gas fillings [2, 2006.01]
H01L 21/56
Hierarchie anzeigen
. . . . Encapsulations, e.g. encapsulating layers, coatings [2, 2006.01]
H01L 21/58
Hierarchie anzeigen
. . . . Mounting semiconductor devices on supports [2, 2006.01]
H01L 21/60
Hierarchie anzeigen
. . . . Attaching leads or other conductive members, to be used for carrying current to or from the device in operation [2, 2006.01]
H01L 21/603
Hierarchie anzeigen
. . . . . involving the application of pressure, e.g. thermo-compression bonding (H01L 21/607 takes precedence) [2, 2006.01]
H01L 21/607
Hierarchie anzeigen
. . . . . involving the application of mechanical vibrations, e.g. ultrasonic vibrations [2, 2006.01]
H01L 21/62
Hierarchie anzeigen
. . the devices having no potential barriers [2, 2006.01]
H01L 21/64
Hierarchie anzeigen
Manufacture or treatment of solid state devices other than semiconductor devices, or of parts thereof, not specially adapted for a single type of device provided for in groups H01L 31/00-H01L 33/00 or in subclasses H10K, H10N [2, 2006.01]
H01L 21/66
Hierarchie anzeigen
Testing or measuring during manufacture or treatment [2, 2006.01]
H01L 21/67
Hierarchie anzeigen
Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components [2006.01]
H01L 21/673
Hierarchie anzeigen
. . using specially adapted carriers [2006.01]
H01L 21/677
Hierarchie anzeigen
. . for conveying, e.g. between different work stations [2006.01]
H01L 21/68
Hierarchie anzeigen
. . for positioning, orientation or alignment [2, 2006.01]
H01L 21/683
Hierarchie anzeigen
. . for supporting or gripping (for positioning, orientation or alignment H01L 21/68) [2006.01]
H01L 21/687
Hierarchie anzeigen
. . . using mechanical means, e.g. chucks, clamps or pinches [2006.01]
H01L 21/70
Hierarchie anzeigen
Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in or on a common substrate or of specific parts thereofManufacture of integrated circuit devices or of specific parts thereof (manufacture of assemblies consisting of preformed electrical components H05K 3/00, H05K 13/00) [2, 2006.01]
H01L 21/71
Hierarchie anzeigen
. . Manufacture of specific parts of devices defined in group H01L 21/70 (H01L 21/28, H01L 21/44, H01L 21/48 take precedence) [6, 2006.01]
H01L 21/74
Hierarchie anzeigen
. . . Making of buried regions of high impurity concentration, e.g. buried collector layers, internal connections [2, 2006.01]
H01L 21/76
Hierarchie anzeigen
. . . Making of isolation regions between components [2, 2006.01]
H01L 21/761
Hierarchie anzeigen
. . . . PN junctions [6, 2006.01]
H01L 21/762
Hierarchie anzeigen
. . . . Dielectric regions [6, 2006.01]
H01L 21/763
Hierarchie anzeigen
. . . . Polycrystalline semiconductor regions [6, 2006.01]
H01L 21/764
Hierarchie anzeigen
. . . . Air gaps [6, 2006.01]
H01L 21/765
Hierarchie anzeigen
. . . . by field-effect [6, 2006.01]
H01L 21/768
Hierarchie anzeigen
. . . Applying interconnections to be used for carrying current between separate components within a device [6, 2006.01]
H01L 21/77
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. . Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate  (manufacture or treatment of electronic memory devices H10B) [6, 2006.01, 2017.01]
H01L 21/78
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. . . with subsequent division of the substrate into plural individual devices (cutting to change the surface-physical characteristics or shape of semiconductor bodies H01L 21/304) [2, 6, 2006.01]
H01L 21/782
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. . . . to produce devices, each consisting of a single circuit element (H01L 21/82 takes precedence) [6, 2006.01]
H01L 21/784
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. . . . . the substrate being a semiconductor body [6, 2006.01]
H01L 21/786
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. . . . . the substrate being other than a semiconductor body, e.g. insulating body [6, 2006.01]
H01L 21/82
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. . . . to produce devices, e.g. integrated circuits, each consisting of a plurality of components [2, 2006.01]
H01L 21/822
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. . . . . the substrate being a semiconductor, using silicon technology (H01L 21/8258 takes precedence) [6, 2006.01]
H01L 21/8222
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. . . . . . Bipolar technology [6, 2006.01]
H01L 21/8224
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. . . . . . . comprising a combination of vertical and lateral transistors [6, 2006.01]
H01L 21/8226
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. . . . . . . comprising merged transistor logic or integrated injection logic [6, 2006.01]
H01L 21/8228
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. . . . . . . Complementary devices, e.g. complementary transistors [6, 2006.01]
H01L 21/8232
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. . . . . . Field-effect technology [6, 2006.01]
H01L 21/8234
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. . . . . . . MIS technology [6, 2006.01]
H01L 21/8236
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. . . . . . . . Combination of enhancement and depletion transistors [6, 2006.01]
H01L 21/8238
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. . . . . . . . Complementary field-effect transistors, e.g. CMOS [6, 2006.01]
H01L 21/8248
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. . . . . . Combination of bipolar and field-effect technology [6, 2006.01]
H01L 21/8249
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. . . . . . . Bipolar and MOS technology [6, 2006.01]
H01L 21/8252
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. . . . . the substrate being a semiconductor, using III-V technology (H01L 21/8258 takes precedence) [6, 2006.01]
H01L 21/8254
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. . . . . the substrate being a semiconductor, using II-VI technology (H01L 21/8258 takes precedence) [6, 2006.01]
H01L 21/8256
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. . . . . the substrate being a semiconductor, using technologies not covered by one of groups H01L 21/822, H01L 21/8252 or H01L 21/8254 (H01L 21/8258 takes precedence) [6, 2006.01]
H01L 21/8258
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. . . . . the substrate being a semiconductor, using a combination of technologies covered by H01L 21/822, H01L 21/8252, H01L 21/8254 or H01L 21/8256 [6, 2006.01]
H01L 21/84
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. . . . . the substrate being other than a semiconductor body, e.g. being an insulating body [2, 6, 2006.01]
H01L 21/86
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. . . . . . the insulating body being sapphire, e.g. silicon on sapphire structure, i.e. SOS [2, 6, 2006.01]
H01L 21/98
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. . Assembly of devices consisting of solid state components formed in or on a common substrateAssembly of integrated circuit devices (H01L 21/50 takes precedence) [2, 5, 2006.01]
H01L 23/00
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Details of semiconductor or other solid state devices (H01L 25/00 takes precedence) [2, 5, 2006.01]
H01L 25/00
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Assemblies consisting of a plurality of individual semiconductor or other solid state devices (devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00; photovoltaic modules or arrays of photovoltaic cells H01L 31/042) [2, 5, 2006.01]
H01L 27/00
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Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (details thereof H01L 23/00, H01L 29/00-H01L 33/00, H10K, H10N; assemblies consisting of a plurality of individual solid state devices H01L 25/00) [2, 2006.01]
H01L 29/00
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Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriersCapacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layerDetails of semiconductor bodies or of electrodes thereof (H01L 31/00-H01L 33/00, H10K 10/00, H10N take precedence; details other than of semiconductor bodies or of electrodes thereof H01L 23/00; devices consisting of a plurality of solid state components formed in or on a common substrate H01L 27/00) [2, 6, 2006.01]
H01L 31/00
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Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiationProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereofDetails thereof (H10K 30/00 takes precedence; devices consisting of a plurality of solid state components formed in, or on, a common substrate, other than combinations of radiation-sensitive components with one or more electric light sources, H01L 27/00) [2, 6, 2006.01]
H01L 33/00
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Semiconductor devices having potential barriers specially adapted for light emissionProcesses or apparatus specially adapted for the manufacture or treatment thereof or of parts thereofDetails thereof (H10K 50/00 takes precedence; devices consisting of a plurality of semiconductor components formed in or on a common substrate and including semiconductor components having potential barriers, specially adapted for light emission H01L 27/15; semiconductor lasers H01S 5/00) [2, 2006.01, 2010.01]
H01M
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PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY [2]
H01P
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WAVEGUIDESRESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE (operating at optical frequencies G02B)
H01Q
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ANTENNAS, i.e. RADIO AERIALS (radiators or antennas for microwave heating H05B 6/72)
H01R
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ELECTRICALLY-CONDUCTIVE CONNECTIONSSTRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTSCOUPLING DEVICESCURRENT COLLECTORS
H01S
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DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHTDEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
H01T
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SPARK GAPSOVERVOLTAGE ARRESTERS USING SPARK GAPSSPARKING PLUGSCORONA DEVICESGENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES (overvoltage protection circuits H02H)
H02
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GENERATION, CONVERSION, OR DISTRIBUTION OF ELECTRIC POWER
H03
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ELECTRONIC CIRCUITRY
H04
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ELECTRIC COMMUNICATION TECHNIQUE
H05
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ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
H10
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SEMICONDUCTOR DEVICESELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR [2023.01]
H99
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SUBJECT MATTER NOT OTHERWISE PROVIDED FOR IN THIS SECTION [2006.01]

Zu vergleichende IPC-Stelle: Es wurden im Verzeichnis noch keine IPC-Stellen für die Vergleichsansicht vorgemerkt. [Version , Sprache ]