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A
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SECTION A — HUMAN NECESSITIES
B
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SECTION B — PERFORMING OPERATIONSTRANSPORTING
C
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SECTION C — CHEMISTRYMETALLURGY
D
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SECTION D — TEXTILESPAPER
E
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SECTION E — FIXED CONSTRUCTIONS
F
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SECTION F — MECHANICAL ENGINEERINGLIGHTINGHEATINGWEAPONSBLASTING
G
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SECTION G — PHYSICS
G01
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INSTRUMENTS
G01
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MEASURINGTESTING
G02
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OPTICS
G03
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PHOTOGRAPHYCINEMATOGRAPHYANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVESELECTROGRAPHYHOLOGRAPHY [4]
G04
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HOROLOGY
G05
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CONTROLLINGREGULATING
G06
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COMPUTINGCALCULATINGCOUNTING
G07
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CHECKING-DEVICES
G08
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SIGNALLING
G09
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EDUCATINGCRYPTOGRAPHYDISPLAYADVERTISINGSEALS
G10
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MUSICAL INSTRUMENTSACOUSTICS
G11
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INFORMATION STORAGE
G11B
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INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER (recording measured values in a way that does not require playback through a transducer G01D 9/00; recording or playback apparatus using mechanically marked tape, e.g. punched paper tape, or using unit records, e.g. punched or magnetically marked cards G06K; transferring data from one type of record carrier to another G06K 1/18;  circuits for coupling output of reproducer to radio receiver H04B 1/20;  gramophone pick-ups or like acoustic electromechanical transducers or circuits therefor H04R)
G11C
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STATIC STORES (information storage based on relative movement between record carrier and transducer G11B; semiconductor devices for storage H01L, e.g. H01L 27/108-H01L 27/115; pulse technique in general H03K, e.g. electronic switches H03K 17/00)
G11C 5/00
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Details of stores covered by group G11C 11/00
G11C 7/00
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Arrangements for writing information into, or reading information out from, a digital store (G11C 5/00 takes precedence; auxiliary circuits for stores using semiconductor devices G11C 11/4063, G11C 11/413, G11C 11/4193) [2, 5]
G11C 8/00
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Arrangements for selecting an address in a digital store (auxiliary circuits for stores using semiconductor devices G11C 11/4063, G11C 11/413, G11C 11/4193) [2, 5]
G11C 11/00
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Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor (G11C 14/00-G11C 21/00 take precedence) [5]
G11C 13/00
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Digital stores characterised by the use of storage elements not covered by groups G11C 11/00, G11C 23/00, or G11C 25/00
G11C 14/00
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Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down [5]
G11C 15/00
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Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores (in which information is addressed to a specific location G11C 11/00) [2]
G11C 16/00
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Erasable programmable read-only memories (G11C 14/00 takes precedence) [5]
G11C 17/00
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Read-only memories programmable only onceSemi-permanent stores, e.g. manually-replaceable information cards (erasable programmable read-only memories G11C 16/00; coding, decoding or code conversion, in general H03M) [2, 5]
G11C 19/00
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Digital stores in which the information is moved stepwise, e.g. shift registers (counting chains H03K 23/00)
G11C 21/00
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Digital stores in which the information circulates (stepwise G11C 19/00)
G11C 23/00
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Digital stores characterised by movement of mechanical parts to effect storage, e.g. using ballsStorage elements therefor (storing by actuating contacts G11C 11/48)
G11C 25/00
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Digital stores characterised by the use of flowing mediaStorage elements therefor
G11C 27/00
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Electric analogue stores, e.g. for storing instantaneous values
G11C 29/00
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Checking stores for correct operationTesting stores during standby or offline operation [1, 2006.01]
G11C 29/02
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Detection or location of defective auxiliary circuits, e.g. defective refresh counters [2006.01]
G11C 29/04
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Detection or location of defective memory elements [2006.01]
G11C 29/06
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. . Acceleration testing [2006.01]
G11C 29/08
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. . Functional testing, e.g. testing during refresh, power-on self testing (POST) or distributed testing [2006.01]
G11C 29/10
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. . . Test algorithms, e.g. memory scan (MScan) algorithmsTest patterns, e.g. checkerboard patterns [2006.01]
G11C 29/12
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. . . Built-in arrangements for testing, e.g. built-in self testing (BIST) [2006.01]
G11C 29/14
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. . . . Implementation of control logic, e.g. test mode decoders [2006.01]
G11C 29/16
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. . . . . using microprogrammed units, e.g. state machines [2006.01]
G11C 29/18
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. . . . Address generation devicesDevices for accessing memories, e.g. details of addressing circuits [2006.01]
G11C 29/20
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. . . . . using counters or linear-feedback shift registers (LFSR) [2006.01]
G11C 29/22
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. . . . . Accessing serial memories [2006.01]
G11C 29/24
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. . . . . Accessing extra cells, e.g. dummy cells or redundant cells [2006.01]
G11C 29/26
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. . . . . Accessing multiple arrays (G11C 29/24 takes precedence) [2006.01]
G11C 29/28
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. . . . . . Dependent multiple arrays, e.g. multi-bit arrays [2006.01]
G11C 29/30
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. . . . . Accessing single arrays [2006.01]
G11C 29/32
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. . . . . . Serial accessScan testing [2006.01]
G11C 29/34
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. . . . . . Accessing multiple bits simultaneously [2006.01]
G11C 29/36
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. . . . Data generation devices, e.g. data inverters [2006.01]
G11C 29/38
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. . . . Response verification devices [2006.01]
G11C 29/40
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. . . . . using compression techniques [2006.01]
G11C 29/42
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. . . . . using error correcting codes (ECC) or parity check [2006.01]
G11C 29/44
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. . . . Indication or identification of errors, e.g. for repair [2006.01]
G11C 29/46
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. . . . Test trigger logic [2006.01]
G11C 29/48
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. . . Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access (DMA) or using auxiliary access paths (external testing equipment G11C 29/56) [2006.01]
G11C 29/50
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. . Marginal testing, e.g. race, voltage or current testing [2006.01]
G11C 29/52
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Protection of memory contentsDetection of errors in memory contents [2006.01]
G11C 29/54
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Arrangements for designing test circuits, e.g. design for test (DFT) tools [2006.01]
G11C 29/56
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External testing equipment for static stores, e.g. automatic test equipment (ATE)Interfaces therefor [2006.01]
G11C 99/00
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Subject matter not provided for in other groups of this subclass [2006.01]
G12
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INSTRUMENT DETAILS
G21
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NUCLEONICS
G21
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NUCLEAR PHYSICSNUCLEAR ENGINEERING
G99
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SUBJECT MATTER NOT OTHERWISE PROVIDED FOR IN THIS SECTION [2006.01]
H
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SECTION H — ELECTRICITY

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