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Symbol IPC-Stellen auswählen Titel
A
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HUMAN NECESSITIES
B
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PERFORMING OPERATIONSTRANSPORTING
C
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CHEMISTRYMETALLURGY
D
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TEXTILESPAPER
E
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FIXED CONSTRUCTIONS
F
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MECHANICAL ENGINEERINGLIGHTINGHEATINGWEAPONSBLASTING
G
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PHYSICS
G01
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MEASURINGTESTING
G02
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OPTICS
G03
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PHOTOGRAPHYCINEMATOGRAPHYANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVESELECTROGRAPHYHOLOGRAPHY [4]
G03B
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APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEMAPPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVESACCESSORIES THEREFOR (optical parts of such apparatus G02B; photosensitive materials or processes for photographic purposes G03C; apparatus for processing exposed photographic materials G03D) [4]
G03C
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PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSESPHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR OR STEREO-PHOTOGRAPHIC PROCESSESAUXILIARY PROCESSES IN PHOTOGRAPHY (photographic processes characterised by the use or manipulation of apparatus classifiable per se in subclass G03B, seeG03B)
G03D
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APPARATUS FOR PROCESSING EXPOSED PHOTOGRAPHIC MATERIALSACCESSORIES THEREFOR
G03F
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PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICESMATERIALS THEREFORORIGINALS THEREFORAPPARATUS SPECIALLY ADAPTED THEREFOR (phototypographic composing devices B41B; photosensitive materials or processes for photographic purposes G03C; electrography, sensitive layers or processes G03G)
G03F 1/00
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Originals for photomechanical production of textured or patterned surfaces, e.g. masks, photo-masks or reticlesMask blanks or pellicles thereforContainers specially adapted thereforPreparation thereof [1, 3, 2006.01, 2012.01]
G03F 1/20
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Masks or mask blanks for imaging by charged particle beam [CPB] radiation, e.g. by electron beamPreparation thereof [2012.01]
G03F 1/22
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Masks or mask blanks for imaging by radiation of 100 nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masksPreparation thereof [2012.01]
G03F 1/24
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. . Reflection masksPreparation thereof [2012.01]
G03F 1/26
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Phase shift masks [PSM]PSM blanksPreparation thereof [2012.01]
G03F 1/28
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. . with three or more diverse phases on the same PSMPreparation thereof [2012.01]
G03F 1/29
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. . Rim PSM or outrigger PSMPreparation thereof [2012.01]
G03F 1/30
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. . Alternating PSM, e.g. Levenson-Shibuya PSMPreparation thereof [2012.01]
G03F 1/32
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. . Attenuating PSM [att-PSM], e.g. halftone PSM or PSM having semi-transparent phase shift portionPreparation thereof [2012.01]
G03F 1/34
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. . Phase-edge PSM, e.g. chromeless PSMPreparation thereof [2012.01]
G03F 1/36
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Masks having proximity correction featuresPreparation thereof, e.g. optical proximity correction [OPC] design processes [2012.01]
G03F 1/38
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Masks having auxiliary features, e.g. special coatings or marks for alignment or testingPreparation thereof [2012.01]
G03F 1/40
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. . Electrostatic discharge [ESD] related features, e.g. antistatic coatings or a conductive metal layer around the periphery of the mask substrate [2012.01]
G03F 1/42
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. . Alignment or registration features, e.g. alignment marks on the mask substrates [2012.01]
G03F 1/44
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. . Testing or measuring features, e.g. grid patterns, focus monitors, sawtooth scales or notched scales  [2012.01]
G03F 1/46
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. . Antireflective coatings [2012.01]
G03F 1/48
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. . Protective coatings [2012.01]
G03F 1/50
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Mask blanks not covered by groups G03F 1/20-G03F 1/26Preparation thereof [2012.01]
G03F 1/52
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Reflectors [2012.01]
G03F 1/54
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Absorbers, e.g. opaque materials [2012.01]
G03F 1/56
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. . Organic absorbers, e.g. photo-resists [2012.01]
G03F 1/58
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. . having two or more different absorber layers, e.g. stacked multilayer absorbers [2012.01]
G03F 1/60
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Substrates [2012.01]
G03F 1/62
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Pellicles or pellicle assemblies, e.g. having membrane on support framePreparation thereof [2012.01]
G03F 1/64
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. . characterised by the frames, e.g. structure or material thereof [2012.01]
G03F 1/66
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Containers specially adapted for masks, mask blanks or pelliclesPreparation thereof [2012.01]
G03F 1/68
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Preparation processes not covered by groups G03F 1/20-G03F 1/50 [2012.01]
G03F 1/70
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. . Adapting basic layout or design of masks to lithographic process requirements, e.g. second iteration correction of mask patterns for imaging [2012.01]
G03F 1/72
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. . Repair or correction of mask defects [2012.01]
G03F 1/74
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. . . by charged particle beam [CPB], e.g. focused ion beam [2012.01]
G03F 1/76
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. . Patterning of masks by imaging [2012.01]
G03F 1/78
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. . . by charged particle beam [CPB], e.g. electron beam [2012.01]
G03F 1/80
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. . Etching [2012.01]
G03F 1/82
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. . Auxiliary processes, e.g. cleaning [2012.01]
G03F 1/84
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. . . Inspecting [2012.01]
G03F 1/86
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. . . . by charged particle beam [CPB] [2012.01]
G03F 1/88
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prepared by photographic processes for producing originals simulating relief [2012.01]
G03F 1/90
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prepared by montage processes [2012.01]
G03F 1/92
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prepared from printing surfaces [2012.01]
G03F 3/00
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Colour separationCorrection of tonal value (photographic copying apparatus in general G03B) [1, 2006.01]
G03F 5/00
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Screening processesScreens therefor [1, 2006.01]
G03F 7/00
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Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfacesMaterials therefor, e.g. comprising photoresistsApparatus specially adapted therefor (using photoresist structures for special production processes, see the relevant places, e.g. B44C, H01L, e.g. H01L 21/00, H05K) [1, 3, 5, 2006.01]
G03F 9/00
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Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically (G03F 7/22 takes precedence; preparation of photographic masks G03F 1/00; within photographic printing apparatus for making copies G03B 27/00) [1, 4, 2006.01]
G03G
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ELECTROGRAPHYELECTROPHOTOGRAPHYMAGNETOGRAPHY (information storage based on relative movement between record carrier and transducer G11B; static stores with means for writing-in or reading-out information G11C; recording of television signals H04N 5/76)
G03H
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HOLOGRAPHIC PROCESSES OR APPARATUS (holograms, e.g. point holograms, used as ordinary optical elements G02B 5/32; analogue computers performing mathematical operations with the aid of optical elements G06E 3/00; holographic storage G11B 7/0065, G11C 13/04) [2]
G04
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HOROLOGY
G05
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CONTROLLINGREGULATING
G06
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COMPUTINGCALCULATING OR COUNTING
G07
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CHECKING-DEVICES
G08
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SIGNALLING
G09
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EDUCATINGCRYPTOGRAPHYDISPLAYADVERTISINGSEALS
G10
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MUSICAL INSTRUMENTSACOUSTICS
G11
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INFORMATION STORAGE
G12
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INSTRUMENT DETAILS
G16
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INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS [2018.01]
G21
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NUCLEAR PHYSICSNUCLEAR ENGINEERING
G99
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SUBJECT MATTER NOT OTHERWISE PROVIDED FOR IN THIS SECTION [2006.01]
H
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ELECTRICITY

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