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Symbol IPC-Stellen auswählen Titel
A
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HUMAN NECESSITIES
B
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PERFORMING OPERATIONSTRANSPORTING
C
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CHEMISTRYMETALLURGY
D
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TEXTILESPAPER
E
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FIXED CONSTRUCTIONS
F
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MECHANICAL ENGINEERINGLIGHTINGHEATINGWEAPONSBLASTING
G
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PHYSICS
G01
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MEASURINGTESTING
G01B
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MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONSMEASURING ANGLESMEASURING AREASMEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01C
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MEASURING DISTANCES, LEVELS OR BEARINGSSURVEYINGNAVIGATIONGYROSCOPIC INSTRUMENTSPHOTOGRAMMETRY OR VIDEOGRAMMETRY (measuring liquid level G01F;  radio navigation, determining distance or velocity by use of propagation effects, e.g. Doppler effect, propagation time, of radio waves, analogous arrangements using other waves G01S)
G01D
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MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLEARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASSTARIFF METERING APPARATUSTRANSFERRING OR TRANSDUCING ARRANGEMENTS NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLEMEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
G01F
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MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVELMETERING BY VOLUME [2, 5]
G01G
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WEIGHING
G01H
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MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES [4]
G01J
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHTCOLORIMETRYRADIATION PYROMETRY [2]
G01K
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MEASURING TEMPERATUREMEASURING QUANTITY OF HEATTHERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR (radiation pyrometry G01J 5/00)
G01L
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MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE (weighing G01G) [4]
G01M
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TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURESTESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
G01N
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
G01N 1/00
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SamplingPreparing specimens for investigation (handling materials for automatic analysis G01N 35/00) [1, 2006.01]
G01N 3/00
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Investigating strength properties of solid materials by application of mechanical stress [1, 2006.01]
G01N 5/00
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Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid (G01N 9/00 takes precedence) [1, 2006.01]
G01N 7/00
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Analysing materials by measuring the pressure or volume of a gas or vapour [1, 2006.01]
G01N 9/00
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Investigating density or specific gravity of materialsAnalysing materials by determining density or specific gravity [1, 2006.01]
G01N 11/00
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Investigating flow properties of materials, e.g. viscosity or plasticityAnalysing materials by determining flow properties [1, 2006.01]
G01N 13/00
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Investigating surface or boundary effects, e.g. wetting powerInvestigating diffusion effectsAnalysing materials by determining surface, boundary, or diffusion effects (scanning-probe techniques or apparatus G01Q) [1, 7, 2006.01]
G01N 15/00
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Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials (identification of microorganisms C12Q) [1, 4, 2006.01]
G01N 17/00
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Investigating resistance of materials to the weather, to corrosion or to light [1, 2006.01]
G01N 19/00
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Investigating materials by mechanical methods (G01N 3/00-G01N 17/00 take precedence) [1, 2006.01]
G01N 21/00
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Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light (G01N 3/00-G01N 19/00 take precedence) [1, 2006.01]
G01N 22/00
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Investigating or analysing materials by the use of microwaves (G01N 3/00-G01N 17/00, G01N 24/00 take precedence) [3, 2006.01]
G01N 23/00
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Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N 3/00-G01N 17/00, G01N 21/00 or G01N 22/00 [1, 2006.01]
G01N 23/02
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by transmitting the radiation through the material [1, 2006.01]
G01N 23/04
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. . and forming images of the material [1, 2006.01, 2018.01]
G01N 23/041
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. . . Phase-contrast imaging, e.g. using grating interferometers [2018.01]
G01N 23/044
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. . . using laminography or tomosynthesis [2018.01]
G01N 23/046
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. . . using tomography, e.g. computed tomography [CT] [2018.01]
G01N 23/05
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. . . using neutrons [3, 2006.01]
G01N 23/06
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. . and measuring the absorption [1, 2006.01, 2018.01]
G01N 23/083
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. . . the radiation being X-rays [5, 2006.01, 2018.01]
G01N 23/085
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. . . . X-ray absorption fine structure [XAFS], e.g. extended XAFS [EXAFS] [2018.01]
G01N 23/087
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. . . . using polyenergetic X-rays [5, 2006.01, 2018.01]
G01N 23/09
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. . . the radiation being neutrons [3, 2006.01, 2018.01]
G01N 23/095
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. . . Gamma-ray resonance absorption, e.g. using the Mössbauer effect [2018.01]
G01N 23/10
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. . . the material being confined in a container, e.g. in luggage X-ray scanners [1, 3, 2006.01, 2018.01]
G01N 23/12
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. . . the material being a flowing fluid or a flowing granular solid [1, 3, 2006.01, 2018.01]
G01N 23/16
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. . . the material being a moving sheet or film [1, 3, 2006.01, 2018.01]
G01N 23/18
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. . . Investigating the presence of defects or foreign matter [1, 3, 5, 2006.01, 2018.01]
G01N 23/20
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by using diffraction of the radiation by the materials, e.g. for investigating crystal structureby using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsby using reflection of the radiation by the materials [1, 2006.01, 2018.01]
G01N 23/20008
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. . Constructional details of analysers, e.g. characterised by X-ray source, detector or optical systemAccessories thereforPreparing specimens therefor  (monochromators for X-rays using crystals G21K 1/06) [2018.01]
G01N 23/20016
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. . . Goniometers [2018.01]
G01N 23/20025
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. . . Sample holders or supports therefor [2018.01]
G01N 23/20033
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. . . . provided with temperature control or heating means [2018.01]
G01N 23/20041
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. . . . for high pressure testing, e.g. anvil cells [2018.01]
G01N 23/2005
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. . . Preparation of powder samples therefor [2018.01]
G01N 23/20058
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. . Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method [2018.01]
G01N 23/20066
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. . Measuring inelastic scattering of gamma rays, e.g. Compton effect [2018.01]
G01N 23/20091
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. . Measuring the energy-dispersion spectrum [EDS] of diffracted radiation [2018.01]
G01N 23/201
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. . Measuring small-angle scattering, e.g. small angle X-ray scattering [SAXS] [2, 2006.01, 2018.01]
G01N 23/202
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. . . using neutrons [3, 2006.01]
G01N 23/203
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. . Measuring back scattering [2, 2006.01]
G01N 23/204
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. . . using neutrons [3, 2006.01]
G01N 23/205
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. . using diffraction cameras [2, 2006.01, 2018.01]
G01N 23/2055
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. . Analysing diffraction patterns [2018.01]
G01N 23/207
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. . Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions [2, 2006.01, 2018.01]
G01N 23/22
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by measuring secondary emission from the material [1, 2, 2006.01, 2018.01]
G01N 23/2202
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. . Preparing specimens therefor [2018.01]
G01N 23/2204
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. . Specimen supports thereforSample conveying means therefor [2018.01]
G01N 23/2206
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. . Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement [2018.01]
G01N 23/2208
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. . . all measurements being of secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement [2018.01]
G01N 23/2209
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. . using wavelength dispersive spectroscopy [WDS] [2018.01]
G01N 23/221
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. . by activation analysis [2, 2006.01]
G01N 23/222
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. . . using neutron activation analysis [NAA] [3, 2006.01]
G01N 23/223
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. . by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence [2, 2006.01]
G01N 23/225
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. . using electron or ion microprobes [2, 2006.01, 2018.01]
G01N 23/2251
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. . . using incident electron beams, e.g. scanning electron microscopy [SEM] [2018.01]
G01N 23/2252
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. . . . Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA] [2018.01]
G01N 23/2254
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. . . . Measuring cathodoluminescence [2018.01]
G01N 23/2255
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. . . using incident ion beams, e.g. proton beams [2018.01]
G01N 23/2257
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. . . . Measuring excited X-rays, i.e. particle-induced X-ray emission [PIXE] [2018.01]
G01N 23/2258
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. . . . Measuring secondary ion emission, e.g. secondary ion mass spectrometry [SIMS]  (mass-to-charge ratio analysis aspects of SIMS for material analysis G01N 27/62) [2018.01]
G01N 23/227
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. . Measuring photoelectric effect , e.g. photoelectron emission microscopy [PEEM] [2, 2006.01, 2018.01]
G01N 23/2273
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. . . Measuring photoelectron spectra, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS] [2018.01]
G01N 23/2276
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. . . using the Auger effect, e.g. Auger electron spectroscopy [AES] [2018.01]
G01N 24/00
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Investigating or analysing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects [3, 4, 5, 2006.01]
G01N 25/00
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Investigating or analysing materials by the use of thermal means (G01N 3/00-G01N 23/00 take precedence) [1, 2006.01]
G01N 27/00
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Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means (G01N 3/00-G01N 25/00 take precedence; measurement or testing of electric or magnetic variables or of electric or magnetic properties of materials G01R) [1, 2006.01]
G01N 29/00
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Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic wavesVisualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object (G01N 3/00-G01N 27/00 take precedence) [1, 4, 2006.01]
G01N 30/00
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Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography (G01N 3/00-G01N 29/00 take precedence) [4, 2006.01]
G01N 31/00
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Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods [1, 4, 2006.01]
G01N 33/00
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Investigating or analysing materials by specific methods not covered by groups G01N 1/00-G01N 31/00 [1, 2006.01]
G01N 35/00
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Automatic analysis not limited to methods or materials provided for in any single one of groups G01N 1/00-G01N 33/00Handling materials therefor [3, 2006.01]
G01N 37/00
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Details not covered by any other group of this subclass [3, 2006.01]
G01P
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MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION OR SHOCKINDICATING PRESENCE OR ABSENCE OF MOVEMENT INDICATING DIRECTION OF MOVEMENT  (measuring angular rate using gyroscopic effects G01C 19/00; combined measuring devices for measuring two or more variables of movement G01C 23/00; measuring velocity of sound G01H 5/00; measuring velocity of light G01J 7/00; determining direction or velocity of solid objects by reflection or reradiation of radio or other waves and based on propagation effects, e.g. Doppler effect, propagation time or direction of propagation, G01S; measuring speed of nuclear radiation G01T)
G01Q
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SCANNING-PROBE TECHNIQUES OR APPARATUSAPPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] [2010.01]
G01R
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MEASURING ELECTRIC VARIABLESMEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J 3/12)
G01S
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RADIO DIRECTION-FINDINGRADIO NAVIGATIONDETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVESLOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVESANALOGOUS ARRANGEMENTS USING OTHER WAVES
G01T
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MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry G01N 23/00; tubes for determining the presence, intensity, density or energy of radiation or particles  H01J 47/00)
G01V
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GEOPHYSICSGRAVITATIONAL MEASUREMENTSDETECTING MASSES OR OBJECTSTAGS (means for indicating the location of accidentally buried, e.g. snow-buried, persons A63B 29/02) [4, 6]
G01W
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METEOROLOGY (radar, sonar, lidar or analogous systems, designed for meteorological use G01S 13/95, G01S 15/88, G01S 17/95)
G02
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OPTICS
G03
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PHOTOGRAPHYCINEMATOGRAPHYANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVESELECTROGRAPHYHOLOGRAPHY [4]
G04
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HOROLOGY
G05
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CONTROLLINGREGULATING
G06
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COMPUTINGCALCULATING OR COUNTING
G07
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CHECKING-DEVICES
G08
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SIGNALLING
G09
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EDUCATINGCRYPTOGRAPHYDISPLAYADVERTISINGSEALS
G10
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MUSICAL INSTRUMENTSACOUSTICS
G11
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INFORMATION STORAGE
G12
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INSTRUMENT DETAILS
G16
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INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS [2018.01]
G21
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NUCLEAR PHYSICSNUCLEAR ENGINEERING
G99
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SUBJECT MATTER NOT OTHERWISE PROVIDED FOR IN THIS SECTION [2006.01]
H
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ELECTRICITY

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