| 54 |
Titel |
TI |
[EN] MEASUREMENT METHOD, MEASUREMENT SYSTEMS AND AUXILIARY MEASUREMENT INSTRUMENTS |
| 71/73 |
Anmelder/Inhaber |
PA |
LEICA GEOSYSTEMS AG, CH
|
| 72 |
Erfinder |
IN |
FAIX OLIVER, CH
;
LAIS JOSEF, CH
;
MAYER TIM, CH
;
METZLER BERNHARD, AT
;
MUELLER JOSEF, CH
;
PETKOV STEFAN, CH
;
SCHEJA JOCHEN, AT
|
| 22/96 |
Anmeldedatum |
AD |
13.12.2018 |
| 21 |
Anmeldenummer |
AN |
201817413328 |
|
Anmeldeland |
AC |
US |
|
Veröffentlichungsdatum |
PUB |
08.09.2022 |
33
31
32 |
Priorität |
PRC
PRN
PRD |
EP
2018084846
20181213
|
| 51 |
IPC-Hauptklasse |
ICM |
G01V 1/00
(2006.01)
|
| 51 |
IPC-Nebenklasse |
ICS |
G01W 1/10
(2006.01)
|
|
IPC-Zusatzklasse |
ICA |
|
|
IPC-Indexklasse |
ICI |
|
|
Gemeinsame Patentklassifikation |
CPC |
G01C 11/06
G01C 15/002
G01V 1/003
G01W 1/10
G06Q 10/103
G06Q 50/08
G06T 19/006
|
|
MCD-Hauptklasse |
MCM |
G01V 1/00
(2006.01)
|
|
MCD-Nebenklasse |
MCS |
G01W 1/10
(2006.01)
|
|
MCD-Zusatzklasse |
MCA |
|
| 57 |
Zusammenfassung |
AB |
[EN] The invention relates to a measurement system, e.g. comprising a total station and an auxiliary measurement instrument in the form of a pole, and/or an auxiliary measurement instrument, e.g. a pole, and/or a method for determining positions in the field of geodesics or on construction sites, e.g. by means of a construction laser. |
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt |
CT |
US020020152053A1
US020020198736A1
US020060192946A1
US020130073366A1
US020140081611A1
US020140300886A1
US020150253137A1
US020160258752A1
|
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt |
CT |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt |
CTNP |
Leica Geosystems AG, Heerbrugg, Complete Laser Scanning System for Mine Surveying (page 4; Key Leica HDS4400 Performance Specifications, https://www.laserscanning-europe.com/sites/default/files/Leica/HDS4400%20Flyer.pdf_Media.pdf (Year: 2009) 0
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt |
CTNP |
|
|
Zitierende Dokumente |
|
Dokumente ermitteln
|
|
Sequenzprotokoll |
|
|
|
Prüfstoff-IPC |
ICP |
G01C 15/00
G01W 1/10
G06T 19/00
|
