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Dokument US020220090910A1 (Seiten: 33)

Bibliografische Daten Dokument US020220090910A1 (Seiten: 33)
INID Kriterium Feld Inhalt
54 Titel TI [EN] SURVEYING SYSTEM AND AUXILIARY MEASURING INSTRUMENT
71/73 Anmelder/Inhaber PA LEICA GEOSYSTEMS AG, CH
72 Erfinder IN BÖSCH THOMAS, AT ; FAIX OLIVER, CH ; GESER MARKUS, CH ; ISELI CLAUDIO, CH ; LENGWEILER PATRIK, CH ; MAAR HANNES, AT ; MÜLLER JOSEF, CH ; SCHEJA JOCHEN, AT
22/96 Anmeldedatum AD 06.12.2021
21 Anmeldenummer AN 202117542743
Anmeldeland AC US
Veröffentlichungsdatum PUB 24.03.2022
33
31
32
Priorität PRC
PRN
PRD
EP
2018079910
31.10.2018
33
31
32
PRC
PRN
PRD
US
202117290218
29.04.2021
51 IPC-Hauptklasse ICM G01B 11/00 (2006.01)
51 IPC-Nebenklasse ICS G01C 15/00 (2006.01)
G01C 15/06 (2006.01)
IPC-Zusatzklasse ICA
IPC-Indexklasse ICI
Gemeinsame Patentklassifikation CPC G01B 11/002
G01B 3/1084
G01C 15/00
G01C 15/002
G01C 15/06
G01S 17/08
MCD-Hauptklasse MCM G01B 11/00 (2006.01)
MCD-Nebenklasse MCS G01C 15/00 (2006.01)
G01C 15/06 (2006.01)
MCD-Zusatzklasse MCA
57 Zusammenfassung AB [EN] A method comprising: setting up a stationary surveying device at a first known positioning in a surrounding area of the object; retrieving from a memory a set of object points of an object to be surveyed and/or to be marked; surveying and/or marking from a first positioning object points of the set of object points that can be surveyed and/or can be marked from the first positioning by means of the free beam, on the basis of a target direction; ascertaining missing object points of a set of object points; relocating the surveying device to a second, unknown positioning in the surrounding area of the object; automatically determining a second positioning by the surveying device on the basis of the knowledge of the first positioning, so that the second positioning is known; surveying and/or marking missing object points by means of the free beam from the second positioning.
56 Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt
CT US000009377298B2
US000009594167B2
US000010337865B2
US000010488519B2
US000010921430B2
US000011313680B2
US000011435182B2
US000011493341B2
US000011536568B2
US020230314618A1
56 Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt
CT
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt
CTNP
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt
CTNP
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Sequenzprotokoll
Prüfstoff-IPC ICP G01B 11/00
G01C 15/00
G01C 15/06
G01C 25/00
G01S 17/08