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Dokument US020170222400A1 (Seiten: 60)

Bibliografische Daten Dokument US020170222400A1 (Seiten: 60)
INID Kriterium Feld Inhalt
54 Titel TI [EN] OPTOELECTRONIC INTEGRATED CIRCUIT
71/73 Anmelder/Inhaber PA OPEL SOLAR INC, US ; UNIV CONNECTICUT, US
72 Erfinder IN TAYLOR GEOFF W, US
22/96 Anmeldedatum AD 06.03.2017
21 Anmeldenummer AN 201715450400
Anmeldeland AC US
Veröffentlichungsdatum PUB 03.08.2017
33
31
32
Priorität PRC
PRN
PRD
US
201414222841
24.03.2014
33
31
32
PRC
PRN
PRD
US
201461962303
29.01.2014
51 IPC-Hauptklasse ICM H01S 5/10 (2006.01)
51 IPC-Nebenklasse ICS G02B 6/134 (2006.01)
G02B 6/13 (2006.01)
G02B 6/293 (2006.01)
H01L 31/0232 (2014.01)
H01L 31/0304 (2006.01)
H01L 31/0352 (2006.01)
H01L 31/112 (2006.01)
H01L 31/11 (2006.01)
H01L 31/18 (2006.01)
H01S 5/042 (2006.01)
H01S 5/062 (2006.01)
H01S 5/20 (2006.01)
H01S 5/30 (2006.01)
IPC-Zusatzklasse ICA
IPC-Indexklasse ICI
Gemeinsame Patentklassifikation CPC G02B 6/131
G02B 6/1347
G02B 6/29338
H01S 5/0225
H01S 5/0421
H01S 5/0424
H01S 5/0425
H01S 5/04257
H01S 5/06203
H01S 5/06226
H01S 5/0625
H01S 5/1028
H01S 5/1032
H01S 5/1042
H01S 5/1071
H01S 5/1075
H01S 5/125
H01S 5/183
H01S 5/187
H01S 5/2027
H01S 5/2063
H01S 5/2086
H01S 5/222
H01S 5/3054
H01S 5/309
H01S 5/34313
H10D 18/00
H10D 18/01
H10D 30/4732
H10D 62/141
H10D 62/343
H10D 62/60
H10D 62/815
H10D 84/01
H10D 84/05
H10D 84/82
H10F 30/245
H10F 30/263
H10F 30/2877
H10F 39/103
H10F 71/1272
H10F 77/1248
H10F 77/143
H10F 77/146
H10F 77/413
H10H 20/812
H10H 20/8142
MCD-Hauptklasse MCM H01S 5/10 (2006.01)
MCD-Nebenklasse MCS G02B 6/134 (2006.01)
G02B 6/13 (2006.01)
G02B 6/293 (2006.01)
H01L 31/0232 (2014.01)
H01L 31/0304 (2006.01)
H01L 31/0352 (2006.01)
H01L 31/112 (2006.01)
H01L 31/11 (2006.01)
H01L 31/18 (2006.01)
H01S 5/042 (2006.01)
H01S 5/062 (2006.01)
H01S 5/20 (2006.01)
H01S 5/30 (2006.01)
MCD-Zusatzklasse MCA
57 Zusammenfassung AB [EN] A semiconductor device includes an n-type ohmic contact layer, cathode and anode electrodes, p-type and n-type modulation doped quantum well (QW) structures, and first and second ion implant regions. The anode electrode is formed on the first ion implant region that contacts the p-type modulation doped QW structure and the cathode electrode is formed by patterning the first and second ion implant regions and the n-type ohmic contact layer. The semiconductor device is configured to operate as at least one of a diode laser and a diode detector. As the diode laser, the semiconductor device emits photons. As the diode detector, the semiconductor device receives an input optical light and generates a photocurrent.
56 Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt
CT US000006965128B2
US020020121647A1
56 Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt
CT
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt
CTNP
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt
CTNP
Zitierende Dokumente Dokumente ermitteln
Sequenzprotokoll
Prüfstoff-IPC ICP G02B 6/134
G02B 6/13
H01L 21/8252
H01L 27/088
H01L 27/144
H01L 29/06
H01L 29/10
H01L 29/36
H01L 29/74
H01L 29/778
H01L 31/0232
H01L 31/0352
H01L 31/18
H01L 33/06
H01L 33/10
H01S 5/022
H01S 5/042
H01S 5/0625
H01S 5/062
H01S 5/10
H01S 5/183
H01S 5/187
H01S 5/20
H01S 5/22
H01S 5/30
H01S 5/343