| 54 |
Titel |
TI |
[EN] SURVEYING APPARATUS WITH POSITIONING DEVICE |
| 71/73 |
Anmelder/Inhaber |
PA |
LEICA GEOSYSTEMS AG, CH
|
| 72 |
Erfinder |
IN |
AUER DANIEL, CH
;
FAIX OLIVER, CH
;
HERBST CHRISTOPH, AT
;
MÜLLER JOSEF, CH
|
| 22/96 |
Anmeldedatum |
AD |
08.12.2015 |
| 21 |
Anmeldenummer |
AN |
201514963011 |
|
Anmeldeland |
AC |
US |
|
Veröffentlichungsdatum |
PUB |
23.06.2016 |
33
31
32 |
Priorität |
PRC
PRN
PRD |
EP
14198460
20141217
|
| 51 |
IPC-Hauptklasse |
ICM |
G01C 1/02
(2006.01)
|
| 51 |
IPC-Nebenklasse |
ICS |
G01C 3/08
(2006.01)
H02K 1/27
(2006.01)
|
|
IPC-Zusatzklasse |
ICA |
|
|
IPC-Indexklasse |
ICI |
|
|
Gemeinsame Patentklassifikation |
CPC |
G01C 1/02
G01C 15/00
G01C 15/002
G01C 3/08
G01D 21/00
G01S 17/42
G01S 7/4817
H02K 1/2795
H02K 21/24
H02K 29/10
H02K 5/1675
|
|
MCD-Hauptklasse |
MCM |
G01C 1/02
(2006.01)
|
|
MCD-Nebenklasse |
MCS |
G01C 3/08
(2006.01)
H02K 1/27
(2006.01)
|
|
MCD-Zusatzklasse |
MCA |
|
| 57 |
Zusammenfassung |
AB |
[EN] Some embodiments of the invention include a surveying apparatus that includes an optoelectronic distance measuring device having a measuring beam path, a base for placing the surveying apparatus, a support which is mounted on the base such that it is rotatable about a vertical axis, a beam directing unit which is mounted in the support such that it is rotatable about a tilting axis, an angle measurement system for measuring the axial positions, and an actuatable positioning device driving the beam directing unit or the support. In some embodiments the positioning device may include a plurality of coils which are arranged in a positionally fixed manner in the form of a ring about the tilting axis and/or vertical axis, with winding axes which are axially parallel to the tilting axis or vertical axis. |
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt |
CT |
|
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt |
CT |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt |
CTNP |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt |
CTNP |
|
|
Zitierende Dokumente |
|
Dokumente ermitteln
|
|
Sequenzprotokoll |
|
|
|
Prüfstoff-IPC |
ICP |
G01C 1/02
G01C 15/00
G01C 3/08
G01S 17/42
G01S 7/481
H02K 1/27
H02K 29/00 AX
H02K 5/167
|
