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Dokument US020150171197A1 (Seiten: 56)

Bibliografische Daten Dokument US020150171197A1 (Seiten: 56)
INID Kriterium Feld Inhalt
54 Titel TI [EN] Single Electron Transistor Device
71/73 Anmelder/Inhaber PA OPEL SOLAR INC, US ; UNIV CONNECTICUT, US
72 Erfinder IN TAYLOR GEOFF W, US
22/96 Anmeldedatum AD 24.11.2014
21 Anmeldenummer AN 201414551619
Anmeldeland AC US
Veröffentlichungsdatum PUB 18.06.2015
33
31
32
Priorität PRC
PRN
PRD
US
201313921311
19.06.2013
33
31
32
PRC
PRN
PRD
US
2012051265
17.08.2012
51 IPC-Hauptklasse ICM H01L 29/66 (2006.01)
51 IPC-Nebenklasse ICS H01L 29/06 (2006.01)
H01L 29/12 (2006.01)
H01L 29/778 (2006.01)
IPC-Zusatzklasse ICA
IPC-Indexklasse ICI
Gemeinsame Patentklassifikation CPC B82Y 10/00
G02B 6/125
H01L 21/0259
H01S 5/026
H01S 5/06203
H01S 5/18358
H01S 5/309
H01S 5/34
H01S 5/3412
H10D 30/475
H10D 48/383
H10D 62/118
H10D 62/125
H10D 62/812
H10D 62/814
H10D 62/8164
H10F 39/10
H10F 71/00
H10F 77/1433
H10F 77/146
H10H 20/01
H10H 20/812
H10H 29/10
MCD-Hauptklasse MCM H01L 29/66 (2006.01)
MCD-Nebenklasse MCS H01L 29/06 (2006.01)
H01L 29/12 (2006.01)
H01L 29/778 (2006.01)
MCD-Zusatzklasse MCA
57 Zusammenfassung AB [EN] A transistor device is provided that includes a gate electrode disposed between source and drain electrodes and overlying a quantum dot structure realized by a modulation doped quantum well structure. A potential barrier surrounds the quantum dot structure. The transistor device can be configured for operation as a single electron transistor by means for biasing the gate and source electrodes to allow for tunneling of a single electron from the source electrode through the potential barrier surrounding the quantum dot structure and into the quantum dot structure, and means for biasing the gate and drain electrodes to allow for selective tunneling of a single electron from the quantum dot structure through the potential barrier surrounding the quantum dot structure to the drain electrode, wherein the selective tunneling of the single electron is based upon spin state of the single electron.
56 Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt
CT US020040081216A1
56 Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt
CT
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt
CTNP
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt
CTNP
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Sequenzprotokoll
Prüfstoff-IPC ICP B82Y 10/00
G02B 6/125
H01L 21/02
H01L 27/144
H01L 27/15
H01L 29/06
H01L 29/12
H01L 29/15
H01L 29/778
H01L 31/0352
H01L 31/18
H01L 33/00
H01L 33/06
H01S 5/00
H01S 5/026
H01S 5/062
H01S 5/183
H01S 5/30
H01S 5/34