| 54 |
Titel |
TI |
[EN] SEMIFINISHED PRODUCT AND HIGH-STRENGTH DEGRADABLE IMPLANT FORMED THEREFROM |
| 71/73 |
Anmelder/Inhaber |
PA |
BIOTRONIK AG, CH
|
| 72 |
Erfinder |
IN |
ANOPUO OKECHUKWU, DE
;
BAYER ULLRICH, DE
;
BLOCK BERND, DE
|
| 22/96 |
Anmeldedatum |
AD |
28.10.2014 |
| 21 |
Anmeldenummer |
AN |
201414525841 |
|
Anmeldeland |
AC |
US |
|
Veröffentlichungsdatum |
PUB |
21.05.2015 |
33
31
32 |
Priorität |
PRC
PRN
PRD |
US
201361905299
20131118
|
| 51 |
IPC-Hauptklasse |
ICM |
A61L 31/02
(2006.01)
|
| 51 |
IPC-Nebenklasse |
ICS |
B21C 23/00
(2006.01)
C22C 23/02
(2006.01)
C22C 23/06
(2006.01)
|
|
IPC-Zusatzklasse |
ICA |
|
|
IPC-Indexklasse |
ICI |
|
|
Gemeinsame Patentklassifikation |
CPC |
A61L 27/047
A61L 27/58
A61L 31/022
A61L 31/148
B21C 23/001
B21C 23/002
B21C 23/06
B21C 23/08
B21C 23/085
B21C 23/10
B21C 25/02
B21C 25/04
B21C 25/08
C22C 23/00
C22C 23/02
C22C 23/06
C22F 1/06
Y10T 428/12
Y10T 428/12389
|
|
MCD-Hauptklasse |
MCM |
A61L 31/02
(2006.01)
|
|
MCD-Nebenklasse |
MCS |
B21C 23/00
(2006.01)
C22C 23/02
(2006.01)
C22C 23/06
(2006.01)
|
|
MCD-Zusatzklasse |
MCA |
|
| 57 |
Zusammenfassung |
AB |
[EN] A semifinished product for an implant and implants produced from the semifinished product, the semifinished product comprising or consisting of a region of a magnesium alloy, which is characterized by a grain size gradient of the magnesium alloy between two opposed surfaces from ≦̸3 µm to ≧8 µm, in each case in relation to the average grain size. Use of the semifinished product for producing corresponding implants, and also a method for producing semifinished products. |
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt |
CT |
US020100061882A1
US020110313527A1
US020140261911A1
|
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt |
CT |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt |
CTNP |
DoITPoMS, https://www.doitpoms.ac.uk/tlplib/mechanical-testing/grainsize.php, accessed 5/1/2017. 9
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt |
CTNP |
|
|
Zitierende Dokumente |
|
Dokumente ermitteln
|
|
Sequenzprotokoll |
|
|
|
Prüfstoff-IPC |
ICP |
A61F 2/00
A61F 2/28
A61L 27/04
A61L 27/58
A61L 31/02
A61L 31/14
B21C 23/06
B21C 23/08
B21C 23/10
B21C 25/02
B21C 25/04
B21C 25/08
C22C 111/00 MW
C22C 23/00
C22C 23/02
C22C 23/06
C22F 1/06
|
