Bibliografische Daten

Dokument US020090115504A1 (Seiten: 12)

Bibliografische Daten Dokument US020090115504A1 (Seiten: 12)
INID Kriterium Feld Inhalt
54 Titel TI [EN] CIRCUIT DESIGN METHODOLOGY TO REDUCE LEAKAGE POWER
71/73 Anmelder/Inhaber PA IBM, US
72 Erfinder IN BONSELS STEFAN, DE ; GEMMEKE TOBIAS, DE ; SCHROEDER FRIEDRICH, DE ; WENDEL DIETER, DE
22/96 Anmeldedatum AD 31.10.2008
21 Anmeldenummer AN 26225508
Anmeldeland AC US
Veröffentlichungsdatum PUB 07.05.2009
33
31
32
Priorität PRC
PRN
PRD
EP
07119899
20071102
51 IPC-Hauptklasse ICM H01L 25/00 (2006.01)
51 IPC-Nebenklasse ICS
IPC-Zusatzklasse ICA
IPC-Indexklasse ICI
Gemeinsame Patentklassifikation CPC H03K 19/0016
H03K 19/09429
MCD-Hauptklasse MCM H01L 25/00 (2006.01)
MCD-Nebenklasse MCS
MCD-Zusatzklasse MCA
57 Zusammenfassung AB [EN] A three stage circuit according to the invention comprises a data input, a data output, a control input, two voltage supply inputs. The first stage is electrically connected to the data input and control input and is defined by a combinatorial circuitry with two outputs. The second stage is defined by at least two transistors connected in series between the two voltage supply inputs with their inputs electrically connected to the respective outputs of the first stage and with a common output such that in connection with the first stage they operate as a tri-state gate. The third stage of that three stage circuit is electrically connected to the control input and the common output of the second stage. The three stage circuit is switched to a low leakage state by a control signal feed via the control input and setting the two transistors in their off state resulting in a second stage with a floating common output filtered by the third stage via the control signal actively driven the data output to a specific logic value.
56 Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt
CT US000004680491A
US000006060906A
US000006515516B2
US000007233197B2
56 Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt
CT
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt
CTNP
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt
CTNP
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Prüfstoff-IPC ICP H01L 25/00