Bibliographic data

Document US020060043470A1 (Pages: 11)

Bibliographic data Document US020060043470A1 (Pages: 11)
INID Criterion Field Contents
54 Title TI [EN] Method for producing a buried N-doped semiconductor zone in a semiconductor body and semiconductor component
71/73 Applicant/owner PA LUTZ JOSEF ; NIEDERNOSTHEIDE FRANZ-JOSEF ; SCHULZE HANS-JOACHIM ; SIEMIENIEC RALF
72 Inventor IN LUTZ JOSEF, DE ; NIEDERNOSTHEIDE FRANZ-JOSEF, DE ; SCHULZE HANS-JOACHIM, DE ; SIEMIENIEC RALF, AT
22/96 Application date AD Aug 11, 2005
21 Application number AN 20187405
Country of application AC US
Publication date PUB Mar 2, 2006
33
31
32
Priority data PRC
PRN
PRD
DE
102004039208
20040812
51 IPC main class ICM H01L 29/76 (2006.01)
51 IPC secondary class ICS H01L 21/22 (2006.01)
IPC additional class ICA
IPC index class ICI
Cooperative patent classification CPC H01L 21/263
H01L 21/26506
H01L 21/266
H01L 29/0878
H01L 29/66333
H01L 29/66712
H01L 29/7395
MCD main class MCM H01L 29/76 (2006.01)
MCD secondary class MCS H01L 21/22 (2006.01)
MCD additional class MCA
57 Abstract AB [EN] A method for producing a buried n-doped semiconductor zone in a semiconductor body. In one embodiment, the method includes producing an oxygen concentration at least in the region to be doped in the semiconductor body. The semiconductor body is irradiated via one side with nondoping particles for producing defects in the region to be doped. A thermal process is carried out. The invention additionally relates to a semiconductor component with a field stop zone.
56 Cited documents identified in the search CT US000004379306A
US000006351024B1
US000006475876B2
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56 Cited documents indicated by the applicant CT
56 Cited non-patent literature identified in the search CTNP
56 Cited non-patent literature indicated by the applicant CTNP
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Sequence listings
Search file IPC ICP H01L 21/22
H01L 29/739
H01L 29/76
H01L 29/78