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Dokument US000012085379B2 (Seiten: 33)

Bibliografische Daten Dokument US000012085379B2 (Seiten: 33)
INID Kriterium Feld Inhalt
54 Titel TI [EN] Surveying system and auxiliary measuring instrument
71/73 Anmelder/Inhaber PA LEICA GEOSYSTEMS AG, CH
72 Erfinder IN BÖSCH THOMAS, AT ; FAIX OLIVER, CH ; GESER MARKUS, CH ; ISELI CLAUDIO, CH ; LENGWEILER PATRIK, CH ; MAAR HANNES, AT ; MÜLLER JOSEF, CH ; SCHEJA JOCHEN, AT
22/96 Anmeldedatum AD 06.12.2021
21 Anmeldenummer AN 202117542743
Anmeldeland AC US
Veröffentlichungsdatum PUB 10.09.2024
33
31
32
Priorität PRC
PRN
PRD
EP
2018079910
31.10.2018
33
31
32
PRC
PRN
PRD
US
202117290218
29.04.2021
51 IPC-Hauptklasse ICM G01C 15/02 (2006.01)
51 IPC-Nebenklasse ICS G01B 11/00 (2006.01)
G01C 15/00 (2006.01)
G01C 15/06 (2006.01)
IPC-Zusatzklasse ICA
IPC-Indexklasse ICI
Gemeinsame Patentklassifikation CPC G01B 11/002
G01B 3/1084
G01C 15/00
G01C 15/002
G01C 15/06
G01S 17/08
MCD-Hauptklasse MCM G01C 15/02 (2006.01)
MCD-Nebenklasse MCS G01B 11/00 (2006.01)
G01C 15/00 (2006.01)
G01C 15/06 (2006.01)
MCD-Zusatzklasse MCA
57 Zusammenfassung AB [EN] A method comprising: setting up a stationary surveying device at a first known positioning in a surrounding area of the object; retrieving from a memory a set of object points of an object to be surveyed and/or to be marked; surveying and/or marking from a first positioning object points of the set of object points that can be surveyed and/or can be marked from the first positioning by means of the free beam, on the basis of a target direction; ascertaining missing object points of a set of object points; relocating the surveying device to a second, unknown positioning in the surrounding area of the object; automatically determining a second positioning by the surveying device on the basis of the knowledge of the first positioning, so that the second positioning is known; surveying and/or marking missing object points by means of the free beam from the second positioning.
56 Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt
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56 Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt
CT JP000005274736B2
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CN000104142122A
CN000104142505A
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CN000104769454A
CN000105358937A
CN000107220741A
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JP002007281672A
JP002018009957A
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56 Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt
CTNP
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt
CTNP CN Decision to Grant Dated May 17, 2024 as received in Application No. 2021115080719, 4 pgs. 1;
CN Office Action dated Dec. 28, 2023 as received in Application No. 202111508071.9. 1;
CN Office Action dated Jan. 31, 2024 as received in Application No. 202111508055.X. 1;
EP Office Action dated Jun. 19, 2023 as received in Application No. 21210064.8. 1;
Extended Search Report from corresponding EP Application No. 21210064, Feb. 28, 2022. 1;
International Search Report in Application No. PCT/EP2018/079910 dated Sep. 23, 2019. 1;
Written Opinion in Application No. PCT/EP2018/079910 dated Sep. 23, 2019. 1
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Prüfstoff-IPC ICP G01B 11/00
G01C 15/00
G01C 15/06