54 |
Titel |
TI |
[EN] Determining the distance of an object |
71/73 |
Anmelder/Inhaber |
PA |
SICK AG, DE
|
72 |
Erfinder |
IN |
GIMPEL HARTMUT, DE
;
HONAL MATTHIAS, DE
|
22/96 |
Anmeldedatum |
AD |
06.05.2020 |
21 |
Anmeldenummer |
AN |
202016868322 |
|
Anmeldeland |
AC |
US |
|
Veröffentlichungsdatum |
PUB |
14.02.2023 |
33 31 32 |
Priorität |
PRC PRN PRD |
DE
102019112300
20190510
|
51 |
IPC-Hauptklasse |
ICM |
G01S 7/4913
(2020.01)
|
51 |
IPC-Nebenklasse |
ICS |
G01S 17/32
(2006.01)
|
|
IPC-Zusatzklasse |
ICA |
G01S 17/36
(2006.01)
|
|
IPC-Indexklasse |
ICI |
|
|
Gemeinsame Patentklassifikation |
CPC |
G01B 11/00
G01B 11/026
G01B 11/028
G01S 17/32
G01S 17/36
G01S 17/42
G01S 7/4802
G01S 7/4817
G01S 7/4913
G01S 7/4915
G01S 7/493
|
|
MCD-Hauptklasse |
MCM |
G01S 7/4913
(2020.01)
|
|
MCD-Nebenklasse |
MCS |
G01S 17/32
(2020.01)
G01S 7/4915
(2020.01)
|
|
MCD-Zusatzklasse |
MCA |
G01S 17/36
(2006.01)
|
57 |
Zusammenfassung |
AB |
[EN] An optoelectronic sensor for determining the distance of an object in a monitoring area has a light transmitter for transmitting transmitted light, a light receiver for generating a received signal from remitted light remitted by the object, and a control and evaluation unit configured to modulate the transmitted light with at least a first frequency and a second frequency, to determine a phase offset between transmitted light and remitted light for the first frequency and the second frequency, and to determine a light time of flight. The control and evaluation unit is configured to determine a first amplitude and a second amplitude for the first frequency and the second frequency from the received signal and to detect whether the transmitted light impinges on an edge in the monitoring area on the basis of an evaluation of the first amplitude and the second amplitude. |
56 |
Entgegengehaltene Patentdokumente/Zitate, in Recherche ermittelt |
CT |
US020070103699A1 US020170219706A1 US020180032211A1 US020180210070A1 US020180278456A1 US020190246963A1
|
56 |
Entgegengehaltene Patentdokumente/Zitate, vom Anmelder genannt |
CT |
DE000019757849B4 DE102013207651A1 EP000002395368A1 EP000002801786A1 US000005216236A US020180284268A1
|
56 |
Entgegengehaltene Nichtpatentliteratur/Zitate, in Recherche ermittelt |
CTNP |
|
56 |
Entgegengehaltene Nichtpatentliteratur/Zitate, vom Anmelder genannt |
CTNP |
German Search Report dated Dec. 9, 2019 corresponding to application No. 102019112300.3. 1
|
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Zitierende Dokumente |
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Dokumente ermitteln
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Sequenzprotokoll |
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Prüfstoff-IPC |
ICP |
G01B 11/00
G01B 11/02
G01S 17/32
G01S 17/36
G01S 17/42
G01S 7/481
G01S 7/48
|