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Dokument US000010790234B2 (Seiten: 25)

Bibliografische Daten Dokument US000010790234B2 (Seiten: 25)
INID Kriterium Feld Inhalt
54 Titel TI [EN] Embedding known-good component in known-good cavity of known-good component carrier material with pre-formed electric connection structure
71/73 Anmelder/Inhaber PA AT & S AUSTRIA TECH & SYSTEMTECHNIK AG, AT
72 Erfinder IN ANDERSON STEVE, AT ; GAVAGNIN MARCO, AT ; LEITGEB MARKUS, AT ; SCHREMS MARTIN, AT ; WINKLER ROLAND, AT
22/96 Anmeldedatum AD 09.11.2018
21 Anmeldenummer AN 201816185283
Anmeldeland AC US
Veröffentlichungsdatum PUB 29.09.2020
33
31
32
Priorität PRC
PRN
PRD
EP
17201225
20171111
51 IPC-Hauptklasse ICM H01L 23/538 (2006.01)
51 IPC-Nebenklasse ICS H01L 21/48 (2006.01)
H01L 21/56 (2006.01)
H01L 21/66 (2006.01)
H01L 21/683 (2006.01)
H01L 23/00 (2006.01)
H01L 23/13 (2006.01)
H01L 23/367 (2006.01)
H01L 23/498 (2006.01)
IPC-Zusatzklasse ICA
IPC-Indexklasse ICI
Gemeinsame Patentklassifikation CPC H01L 21/4853
H01L 21/486
H01L 21/561
H01L 21/6835
H01L 22/12
H01L 22/14
H01L 22/20
H01L 2221/68345
H01L 2221/68359
H01L 2224/95001
H01L 23/13
H01L 23/367
H01L 23/49811
H01L 23/5384
H01L 23/5386
H01L 23/5389
H01L 24/97
MCD-Hauptklasse MCM H01L 23/538 (2006.01)
MCD-Nebenklasse MCS H01L 21/48 (2006.01)
H01L 21/56 (2006.01)
H01L 21/66 (2006.01)
H01L 21/683 (2006.01)
H01L 23/00 (2006.01)
H01L 23/13 (2006.01)
H01L 23/367 (2006.01)
H01L 23/498 (2006.01)
MCD-Zusatzklasse MCA
57 Zusammenfassung AB [EN] A method of manufacturing a component carrier includes providing a known-good layer stack comprising an already formed electrically conductive connection structure and a known-good cavity, and mounting a known-good component on the already formed electrically conductive connection structure in the cavity.
56 Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt
CT US020080117607A1
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US020150008566A1
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56 Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt
CT EP000001734581A1
US000007727802B2
US000008431438B2
US000009338891B2
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US000009516740B2
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US020110018123A1
US020130147041A1
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US020160044789A1
US020160086894A1
US020160118332A1
US020160118333A1
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US020160322295A1
WO002017046762A1
WO002017046764A1
WO002017046765A1
WO002017093907A1
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt
CTNP
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt
CTNP
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Sequenzprotokoll
Prüfstoff-IPC ICP H01L 21/56
H01L 21/66
H01L 21/683
H01L 23/00
H01L 23/13
H01L 23/367
H01L 23/498
H01L 23/538