| 54 |
Title |
TI |
[EN] Method device and system for optical near-field scanning microscopy of test specimens in liquids |
| 71/73 |
Applicant/owner |
PA |
HUELS CHEMISCHE WERKE AG, DE
|
| 72 |
Inventor |
IN |
KIRSTEIN STEFAN, DE
;
LOHR FRAUKE, DE
;
MERTESDORF MICHAEL, DE
;
SCHOENHOFF MONIKA, SE
|
| 22/96 |
Application date |
AD |
May 9, 1997 |
| 21 |
Application number |
AN |
85416897 |
|
Country of application |
AC |
US |
|
Publication date |
PUB |
Nov 17, 1998 |
33
31
32 |
Priority data |
PRC
PRN
PRD |
DE
19631498
19960803
|
| 51 |
IPC main class |
ICM |
H01J 3/14
|
| 51 |
IPC secondary class |
ICS |
|
|
IPC additional class |
ICA |
|
|
IPC index class |
ICI |
|
|
Cooperative patent classification |
CPC |
B82Y 20/00
B82Y 35/00
G01Q 10/06
G01Q 20/02
G01Q 30/14
G01Q 60/20
G01Q 60/22
|
|
MCD main class |
MCM |
G01N 37/00
(2006.01)
|
|
MCD secondary class |
MCS |
G01N 21/64
(2006.01)
G01Q 10/06
(2010.01)
G01Q 20/02
(2010.01)
G01Q 30/14
(2010.01)
G01Q 60/18
(2010.01)
G01Q 60/20
(2010.01)
G02B 21/00
(2006.01)
|
|
MCD additional class |
MCA |
|
| 57 |
Abstract |
AB |
[EN] A method, device, and system for optical near-field scanning microscopy on a test specimen in a liquid uses a light source that guides light focused on an optical fiber tip disposed near the test specimen. With the aid of the light beam extending largely parallel to the specimen surface, a diffraction pattern is formed downstream of the light source and the optical fiber tip. The diffraction pattern is detected and a resulting detection signal, which is indicative of a vibrational amplitude of the optical fiber tip, is used for controlling the distance between the optical fiber tip and the specimen, where the distance is related to the vibrational amplitude. Accordingly, optical near-field scanning microscopy may be performed in virtually any liquid, on non-smooth specimen surfaces, and on specimen surfaces whose features change with time. |
| 56 |
Cited documents identified in the search |
CT |
EP000000545538A1
EP000000701102A1
US000005693938A
|
| 56 |
Cited documents indicated by the applicant |
CT |
|
| 56 |
Cited non-patent literature identified in the search |
CTNP |
George J. Collins, Laser Focus World, vol. 31, No. 11, pp. 104 107, Nov. 1, 1995, Near Field Microscopy Moves into the Mainstream . 0;
Kenneth D. Weston, et al., Review of Scientific Instruments, vol. 67, No. 8, pp. 2924 2929, Aug. 1996, Near Field Scanning Optical Microscopy in Reflection: A Study of Far Field Collection Geometry Effects . 0;
Patrick J. Moyer, et al., Applied Physics Letter, vol. 68, No. 24, pp. 3380 3382, Jun. 10, 1996, High Resolution Imaging using Near Field Scanning Optical Microscopy and Shear Force Feedback in Water . 0
|
| 56 |
Cited non-patent literature indicated by the applicant |
CTNP |
|
|
Citing documents |
|
US000006043485A
US000006271513B1
US000006452161B1
US000006479817B1
US000006621079B1
US000006949732B2
US000008332960B2
US000009418421B1
US000010238369B2
US000010684307B2
US000010928628B2
US000010973400B2
US000011391942B2
US020030015651A1
US020110162117A1
US020170354323A1
US020180143221A1
US020190310466A1
|
|
Sequence listings |
|
|
|
Search file IPC |
ICP |
G01N 21/17
G12B 21/06
|
