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Dokument JP002020098194A (Seiten: 17)

Bibliografische Daten Dokument JP002020098194A (Seiten: 17)
INID Kriterium Feld Inhalt
54 Titel TI [EN] PHOTOELECTRONIC SENSOR AND OBJECT DETECTION METHOD
71/73 Anmelder/Inhaber PA SICK AG
72 Erfinder IN HARTMUT GIMPEL ; MATTHIAS JAEGEL
22/96 Anmeldedatum AD 17.10.2019
21 Anmeldenummer AN 2019190117
Anmeldeland AC JP
Veröffentlichungsdatum PUB 25.06.2020
33
31
32
Priorität PRC
PRN
PRD
DE
102018125826
20181018
51 IPC-Hauptklasse ICM G01S 7/481 (2006.01)
51 IPC-Nebenklasse ICS
IPC-Zusatzklasse ICA
IPC-Indexklasse ICI
Gemeinsame Patentklassifikation CPC G01S 17/08
G01S 17/10
G01S 17/93
G01S 7/481
G01S 7/4815
G01S 7/4816
G01S 7/4817
MCD-Hauptklasse MCM G01S 7/481 (2006.01)
MCD-Nebenklasse MCS
MCD-Zusatzklasse MCA
57 Zusammenfassung AB [EN] To provide a photoelectric sensor for detecting an object in a monitoring area.SOLUTION: A photoelectronic sensor includes: at least one light emitter (22) for delivering a plurality of light beams 26 that are separated from each other from one light emission point respectively; a light emission optical system (24) for the delivered light beam 26; at least one light receiver (32) for generating each light reception signal from each reflection light beam (28) reflected by an object and incident on each light reception point; a light reception optical system (30) for the reflection light beam (28); and an evaluation unit (40) for obtaining information on the object from the light reception signal. The light reception optical system (30) and/or the light emission optical system (24) are a dual-lens type objective lens for an annular image field of an image field angle &agr;. The objective lens includes a first lens and a second lens. The first lens is configured such that a light flux of any individual light emission point and/or light reception point having the image field angle &agr; hits on only a half of the second lens.SELECTED DRAWING: Figure 1
56 Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt
CT CN000107861317A
JP000H08178749A
JP002015148605A
US020060187470A1
US020180292512A1
56 Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt
CT
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt
CTNP
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt
CTNP
Zitierende Dokumente JP002023004830A
Sequenzprotokoll
Prüfstoff-IPC ICP G01S 17/08
G01S 17/10
G01S 7/481
G01V 8/18
G01V 8/20
G05B 9/02