| 54 |
Titel |
TI |
[EN] OPTOELECTRONIC SENSOR AND METHOD FOR DETECTING OBJECT |
| 71/73 |
Anmelder/Inhaber |
PA |
SICK AG
|
| 72 |
Erfinder |
IN |
HARTMUT GIMPEL
|
| 22/96 |
Anmeldedatum |
AD |
29.07.2019 |
| 21 |
Anmeldenummer |
AN |
2019138596 |
|
Anmeldeland |
AC |
JP |
|
Veröffentlichungsdatum |
PUB |
05.03.2020 |
33
31
32 |
Priorität |
PRC
PRN
PRD |
DE
102018118653
20180801
|
| 51 |
IPC-Hauptklasse |
ICM |
G01S 7/481
(2006.01)
|
| 51 |
IPC-Nebenklasse |
ICS |
|
|
IPC-Zusatzklasse |
ICA |
|
|
IPC-Indexklasse |
ICI |
|
|
Gemeinsame Patentklassifikation |
CPC |
G01S 17/08
G01S 17/89
G01S 7/481
G01S 7/4816
G01S 7/4817
G01S 7/4876
|
|
MCD-Hauptklasse |
MCM |
G01S 7/481
(2006.01)
|
|
MCD-Nebenklasse |
MCS |
|
|
MCD-Zusatzklasse |
MCA |
|
| 57 |
Zusammenfassung |
AB |
[EN] To provide an optoelectronic sensor which improves suppression of external light using an optical filter in the optoelectronic sensor for detecting an object in a monitoring area.SOLUTION: An optoelectronic sensor includes: a light transmitter 12 for transmitting transmitted light 16 of a wavelength range; a light receiver 32 for generating a received signal from the transmitted light 22 reflected by a surface of an object 20; a reception optics arranged in front of the light receiver 32, the reception optics 24 comprising at least a first optical element 26 for focusing the reflected transmitted light 22, a second optical element 28 for reducing the angle of incidence, and an optical filter 30 tuned to the wavelength range for suppressing external light; and an evaluation unit 34 which is configured to generate object information from the received signal. The second optical element 28 comprises light scattering properties.SELECTED DRAWING: Figure 1 |
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt |
CT |
CN000102102847A
JP002009029350A
JP002012154642A
US020180052234A1
WO002017146913A1
|
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt |
CT |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt |
CTNP |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt |
CTNP |
|
|
Zitierende Dokumente |
|
Dokumente ermitteln
|
|
Sequenzprotokoll |
|
|
|
Prüfstoff-IPC |
ICP |
G01S 17/08
G01S 7/481
G02B 5/02
|
