| 54 |
Titel |
TI |
[DE] SPANNUNGSMESSVERFAHREN UND LEISTUNGSSCHALTUNG
[EN] VOLTAGE MEASURING METHOD AND POWER CIRCUIT
[FR] PROCÉDÉ DE MESURE DE TENSION ET CIRCUIT DE PUISSANCE |
| 71/73 |
Anmelder/Inhaber |
PA |
AIRBUS SAS, FR
|
| 72 |
Erfinder |
IN |
GALEK MAREK, DE
;
GALLA GOWTHAM, DE
;
KAPAUN FLORIAN, DE
;
KLUGBAUER JOSEF, DE
;
STEINER GERHARD, DE
;
SURAPANENI RAVI KIRAN, DE
|
| 22/96 |
Anmeldedatum |
AD |
26.10.2023 |
| 21 |
Anmeldenummer |
AN |
23206018 |
|
Anmeldeland |
AC |
EP |
|
Veröffentlichungsdatum |
PUB |
30.04.2025 |
33
31
32 |
Priorität |
PRC
PRN
PRD |
|
| 51 |
IPC-Hauptklasse |
ICM |
G01R 19/00
(2006.01)
|
| 51 |
IPC-Nebenklasse |
ICS |
G01R 31/42
(2006.01)
H02M 1/00
(2006.01)
H02M 3/335
(2006.01)
H03K 17/14
(2006.01)
|
|
IPC-Zusatzklasse |
ICA |
|
|
IPC-Indexklasse |
ICI |
|
|
Gemeinsame Patentklassifikation |
CPC |
G01R 19/0092
G01R 31/42
H02M 1/0009
H02M 1/0054
H02M 1/088
H02M 7/5387
H03K 17/0822
H03K 2217/0027
|
|
MCD-Hauptklasse |
MCM |
G01R 19/00
(2006.01)
|
|
MCD-Nebenklasse |
MCS |
G01R 31/42
(2006.01)
H02M 1/00
(2006.01)
H02M 3/335
(2006.01)
H03K 17/14
(2006.01)
|
|
MCD-Zusatzklasse |
MCA |
|
| 57 |
Zusammenfassung |
AB |
[EN] The invention relates to the field of power electronics. In order to enable a more uniform current flow through multiple power modules that are coupled in parallel during switching operations, a voltage measuring method for measuring voltage in an electrical power circuit (14) comprising at least one switching element is provided. The voltage measuring method comprises measuring the voltage over a parasitic element (42, L1-L4) of the power circuit (14). |
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt |
CT |
CN000108880515A
DE102020203123A1
US000011444613B1
US020150162902A1
WO002015070344A1
|
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt |
CT |
US000004234805A
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt |
CTNP |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt |
CTNP |
|
|
Zitierende Dokumente |
|
keine Treffer
|
|
Sequenzprotokoll |
|
|
|
Prüfstoff-IPC |
ICP |
H03K 17/082
H03K 17/14
|
