| 54 |
Title |
TI |
[DE] VERMESSUNGSSYSTEM UND MESSHILFSINSTRUMENT
[EN] SURVEYING SYSTEM AND AUXILIARY MEASURING DEVICE
[FR] SYSTÈME D'ARPENTAGE ET INSTRUMENT DE MESURE |
| 71/73 |
Applicant/owner |
PA |
LEICA GEOSYSTEMS AG, CH
|
| 72 |
Inventor |
IN |
BÖSCH THOMAS, AT
;
FAIX OLIVER, CH
;
GESER MARKUS, CH
;
ISELI CLAUDIO, CH
;
LENGWEILER PATRIK, CH
;
MAAR HANNES, AT
;
MÜLLER JOSEF, CH
;
SCHEJA JOCHEN, AT
|
| 22/96 |
Application date |
AD |
Oct 31, 2018 |
| 21 |
Application number |
AN |
18796917 |
|
Country of application |
AC |
EP |
|
Publication date |
PUB |
Sep 8, 2021 |
33
31
32 |
Priority data |
PRC
PRN
PRD |
EP
2018079910
20181031
|
| 51 |
IPC main class |
ICM |
G01C 15/06
(2006.01)
|
| 51 |
IPC secondary class |
ICS |
G01B 11/00
(2006.01)
G01B 5/004
(2006.01)
G01C 15/00
(2006.01)
|
|
IPC additional class |
ICA |
|
|
IPC index class |
ICI |
|
|
Cooperative patent classification |
CPC |
G01B 11/002
G01B 3/1084
G01C 15/00
G01C 15/002
G01C 15/06
G01S 17/08
|
|
MCD main class |
MCM |
G01C 15/06
(2006.01)
|
|
MCD secondary class |
MCS |
G01B 11/00
(2006.01)
G01B 5/004
(2006.01)
G01C 15/00
(2006.01)
|
|
MCD additional class |
MCA |
|
| 57 |
Abstract |
AB |
|
| 56 |
Cited documents identified in the search |
CT |
|
| 56 |
Cited documents indicated by the applicant |
CT |
|
| 56 |
Cited non-patent literature identified in the search |
CTNP |
|
| 56 |
Cited non-patent literature indicated by the applicant |
CTNP |
|
|
Citing documents |
|
Determine documents
|
|
Sequence listings |
|
|
|
Search file IPC |
ICP |
|
