| 54 |
Titel |
TI |
[DE] Vorrichtung und Verfahren zur ortsauflösende Photodetektion und Demodulation von modulierten elektromagnetischen Wellen
[EN] Device and method for spatially resolved photodetection and demodulation of modulated electromagnetic waves
[FR] Dispositif et procédé de détection avec résolution spatiale et démodulation d'ondes électromagnétiques modulées |
| 71/73 |
Anmelder/Inhaber |
PA |
SUISSE ELECTRONIQUE MICROTECH, CH
|
| 72 |
Erfinder |
IN |
LANGE ROBERT, CH
;
SEITZ PETER, CH
|
| 22/96 |
Anmeldedatum |
AD |
28.04.2000 |
| 21 |
Anmeldenummer |
AN |
00109271 |
|
Anmeldeland |
AC |
EP |
|
Veröffentlichungsdatum |
PUB |
07.11.2001 |
33
31
32 |
Priorität |
PRC
PRN
PRD |
|
| 51 |
IPC-Hauptklasse |
ICM |
G01S 17/89
|
| 51 |
IPC-Nebenklasse |
ICS |
G01S 17/10
G01S 7/486
H04N 5/225
|
|
IPC-Zusatzklasse |
ICA |
|
|
IPC-Indexklasse |
ICI |
|
|
Gemeinsame Patentklassifikation |
CPC |
G01S 17/10
G01S 17/894
G01S 7/4816
G01S 7/4863
|
|
MCD-Hauptklasse |
MCM |
G01J 1/02
(2006.01)
G01S 17/10
(2020.01)
|
|
MCD-Nebenklasse |
MCS |
G01J 1/42
(2006.01)
G01S 17/894
(2020.01)
G01S 7/4863
(2020.01)
H01L 27/148
(2006.01)
H01L 27/14
(2006.01)
H01L 31/0232
(2006.01)
|
|
MCD-Zusatzklasse |
MCA |
|
| 57 |
Zusammenfassung |
AB |
[EN] The device and method for spatially resolved photodetection and demodulation of temporally modulated electromagnetic waves make possible to measure phase, amplitude and offset of a temporally modulated, spatially coded radiation field. A micro-optical element (41) spatially averages a portion (30) of the scene and equally distributes the averaged intensity on two photo sites (51.1, 51.2) close to each other. Adjacent to each of these photo sites (51.1) are two storage areas (54.1, 54.2) into which charge from the photo site can be moved quickly (with a speed of several MHz to several tens or even hundreds of MHz) and accumulated essentially free of noise. This is possible by employing the charge-coupled device (CCD) principle. The device can be operated in two modes for two types of modulated radiation fields: (1) sinusoidal radiation signals are demodulated by operating the photo sites (51.1, 51.2) and their storage areas (54.1-54.4) in quadrature, i.e., by applying the clocking signals to the second photo site (51.2) and its storage areas (54.3, 54.4) with a delay of a quarter of the repetition period compared to the first photo site (51.1) and its storage areas (54.1, 54.2); (2) pulsed radiation signals are measured by switching the first photo site's storage part from the first (54.1) to the second area (54.2) during the arrival of the radiation pulse, whereby the second photo site (51.2) and its storage areas (54.3, 54.4) are used for offset measurements without emitted and received radiation. The device combines a high optical fill factor, insensitivity to offset errors, high sensitivity even with little light, simultaneous data acquisition, small pixel size and maximum efficiency in use of available signal photons for sinusoidal as well as pulsed radiation signals. Preferential use is in a time-of-flight (TOF) range imaging system without moving parts, offering 2D or 3D range data. <IMAGE> |
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt |
CT |
DE000004440613C1
DE000019704496A1
DE000019821974A1
US000004796997A
US000004915498A
US000005850282A
WO001997026761A1
|
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt |
CT |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt |
CTNP |
SCHWARTE R ET AL: "NEUARTIGE 3D-VISIONSYSTEME AUF DER BASIS LAYOUT-OPTIMIERTER PMD- STRUKTUREN", TECHNISCHES MESSEN TM, R.OLDENBOURG VERLAG. MUNCHEN, DE, vol. 65, no. 7/08, 1 July 1998 (1998-07-01), pages 264 - 271, XP000847213, ISSN: 0171-8096 2
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt |
CTNP |
|
|
Zitierende Dokumente |
|
CN000001312489C
CN000107430192A
CN000114175618A
DE102004038302A1
DE102005011116A1
DE102005011116B4
DE112010003752T5
EP000001622200A1
EP000001752793A1
EP000001762862A1
EP000001952752A1
EP000001952752B1
EP000002264481A1
EP000002275833A1
EP000002302564A1
IL000000258130A
JP000004828794B2
JP002005518677A
US000007081980B2
US000007138646B2
US000007186965B2
US000007462808B2
US000007498621B2
US000007560701B2
US000007609367B2
US000007897928B2
US000007923673B2
US000008210175B2
US000008299504B2
US000008721525B2
US000009209327B2
US000009400917B2
US000010401496B2
US000010908266B2
WO002003073602A3
WO002004008175A1
WO002005052633A1
WO002006010284A1
WO002007028774A1
WO002011000815A1
WO002011020921A1
WO002011036090A1
WO002011117162A1
WO002014000793A1
WO002017050633A1
WO002019162298A1
|
|
Sequenzprotokoll |
|
|
|
Prüfstoff-IPC |
ICP |
G01S 17/36
G01S 17/89
H04N 5/225
|
