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Document EP000000183043B1 (Pages: 7)

Bibliographic data Document EP000000183043B1 (Pages: 7)
INID Criterion Field Contents
54 Title TI [EN] ARRANGEMENT FOR X-RAY ANALYSIS
71/73 Applicant/owner PA SIEMENS AKTIENGESELLSCHAFT
72 Inventor IN KRAEFT, UWE, DIPL.-MIN.
22/96 Application date AD Oct 21, 1985
21 Application number AN 85113344
Country of application AC EP
Publication date PUB Sep 27, 1989
33
31
32
Priority data PRC
PRN
PRD
DE
3438637
Oct 22, 1984
33
31
32
PRC
PRN
PRD
DE
3441539
Nov 14, 1984
33
31
32
PRC
PRN
PRD
DE
3506605
Feb 25, 1985
51 IPC main class ICM G01N 23/207
51 IPC secondary class ICS G01N 23/223
IPC additional class ICA
IPC index class ICI
Cooperative patent classification CPC G01N 2223/076
G01N 23/207
G01N 23/223
MCD main class MCM
MCD secondary class MCS G01N 23/207 (2006.01)
G01N 23/223 (2006.01)
MCD additional class MCA
57 Abstract AB
56 Cited documents identified in the search CT
56 Cited documents indicated by the applicant CT
56 Cited non-patent literature identified in the search CTNP
56 Cited non-patent literature indicated by the applicant CTNP
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