Bibliographic data

Document DE102010022941A1 (Pages: 8)

Bibliographic data Document DE102010022941A1 (Pages: 8)
INID Criterion Field Contents
54 Title TI [DE] Adsorptionswärmepumpe mit Zweiphasen-Thermosiphon als thermische Dioden
[EN] Zeolite heat pump has two-phase thermosiphon that is formed as thermal diode, where absorbent, evaporation part of hot thermosiphon and condensation part of cold thermosiphon are located in container
71/73 Applicant/owner PA Enders, Torsten, 09496, Marienberg, DE ; Klotsche, Michael, Dipl.-Ing. Univ., 01809, Heidenau, DE
72 Inventor IN Enders, Torsten, 09496, Marienberg, DE ; Klotsche, Michael, Dipl.-Ing. Univ., 01809, Heidenau, DE
22/96 Application date AD Jun 8, 2010
21 Application number AN 102010022941
Country of application AC DE
Publication date PUB Dec 8, 2011
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32		 Priority data PRC
PRN
PRD

51 IPC main class ICM F25B 30/04 (2006.01)
51 IPC secondary class ICS
IPC additional class ICA
IPC index class ICI
Cooperative patent classification CPC F25B 17/08
F25B 30/04
Y02A 30/27
Y02B 30/62
MCD main class MCM F25B 30/04 (2006.01)
MCD secondary class MCS
MCD additional class MCA
57 Abstract AB [DE] Zeolithwärmepumpe mit Zweiphasen-Thermosiphons als thermische Dioden, dadurch gekennzeichnet dass sich das Adsorptionsmittel, der Verdampfungsteil des warmen Thermosiphons und der Kondensationsteil des kalten Thermosiphons in einem Behälter befinden.
[EN] The zeolite heat pump has two-phase thermosiphon that is formed as thermal diode, where an absorbent (8), an evaporation part of the hot thermosiphon (3) and a condensation part of the cold thermosiphon (4) are located in a container (1). The absorbent is located in contact with the upper surface of a heat exchanger (7).
56 Cited documents identified in the search CT US000005157937A
US000005408847A
56 Cited documents indicated by the applicant CT DE000010217443B4
56 Cited non-patent literature identified in the search CTNP
56 Cited non-patent literature indicated by the applicant CTNP Peterson, G. P: An Introduction to Heatpipes - Modelling, Testing and Applications. John Wiley & Sons. New York, 1994. Seite 218 1
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