| 54 |
Titel |
TI |
[DE] Vorrichtung zum Bearbeiten, insbesondere zum Polieren und Strukturieren von beliebigen 3D-Formflächen mittels eines Laserstrahls |
| 71/73 |
Anmelder/Inhaber |
PA |
Bestenlehrer, Alexander, 91074 Herzogenaurach, DE
|
| 72 |
Erfinder |
IN |
|
| 22/96 |
Anmeldedatum |
AD |
06.04.1995 |
| 21 |
Anmeldenummer |
AN |
29505985 |
|
Anmeldeland |
AC |
DE |
|
Veröffentlichungsdatum |
PUB |
31.08.1995 |
33
31
32 |
Priorität |
PRC
PRN
PRD |
|
| 51 |
IPC-Hauptklasse |
ICM |
B23K 26/00
|
| 51 |
IPC-Nebenklasse |
ICS |
|
|
IPC-Zusatzklasse |
ICA |
|
|
IPC-Indexklasse |
ICI |
|
|
Gemeinsame Patentklassifikation |
CPC |
B23K 26/02
B23K 26/032
B23K 26/04
B23K 26/0665
B23K 26/10
B23K 26/355
B23K 26/3576
G05B 19/4099
G05B 19/4207
G05B 2219/35062
G05B 2219/45165
G05B 2219/49008
G05B 2219/50063
G05B 2219/50071
|
|
MCD-Hauptklasse |
MCM |
G01B 21/30
(2006.01)
|
|
MCD-Nebenklasse |
MCS |
B23K 26/00
(2014.01)
B23K 26/04
(2006.01)
B23K 26/06
(2006.01)
B23K 26/10
(2006.01)
G05B 19/408
(2006.01)
G05B 19/4099
(2006.01)
G05B 19/42
(2006.01)
|
|
MCD-Zusatzklasse |
MCA |
|
| 57 |
Zusammenfassung |
AB |
[EN] Laser machining process, esp. for polishing and texturing of any 2-D or 3-D surface, whereby the surface to be machined is scanned by means of a 3-D contour measuring unit and the data is stored in a reference coordinate system (actual shape), the laser machining parameters being derived from a comparison of actual and required shape. After machining, the surface is scanned again and, if necessary, machining with new parameters is repeated until the required shape has been attained. Laser machining equipment comprising a 3-D contour measuring unit and a control system for the measuring and laser machining units is also claimed. |
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt |
CT |
DE000002624121A1
DE000003226448A1
DE000003711470A1
DE000004219809A1
DE000004333501A1
US000004825035A
US000004914270A
|
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt |
CT |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt |
CTNP |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt |
CTNP |
|
|
Zitierende Dokumente |
|
Dokumente ermitteln
|
|
Sequenzprotokoll |
|
|
|
Prüfstoff-IPC |
ICP |
B23K 26/03
|
