54 |
Title |
TI |
[DE] Verfahren zur Bestimmung des Füllgrads oder der Güte eines Gase speichernden Katalysators |
71/73 |
Applicant/owner |
PA |
DaimlerChrysler AG, 70567 Stuttgart, DE
|
72 |
Inventor |
IN |
Busch, Michael Rainer, 73061 Ebersbach, DE
;
Knezevic, Aleksandar, Dr., 80538 München, DE
;
Moos, Ralf, Dr., 88048 Friedrichshafen, DE
;
Plog, Carsten, Dr., 88677 Markdorf, DE
|
22/96 |
Application date |
AD |
Feb 13, 1998 |
21 |
Application number |
AN |
19805928 |
|
Country of application |
AC |
DE |
|
Publication date |
PUB |
Sep 2, 1999 |
33 31 32 |
Priority data |
PRC PRN PRD |
|
51 |
IPC main class |
ICM |
G01N 27/02
|
51 |
IPC secondary class |
ICS |
B01D 53/30
F01N 9/00
G01M 15/00
G01N 21/41
G01N 21/55
G01N 7/02
|
|
IPC additional class |
ICA |
|
|
IPC index class |
ICI |
|
|
Cooperative patent classification |
CPC |
B01D 53/9495
F01N 11/002
F01N 2560/12
F01N 3/0807
F01N 3/0814
F01N 3/0842
F01N 3/0864
F01N 3/0871
F02D 2200/0806
Y02T 10/40
|
|
MCD main class |
MCM |
G01N 25/00
(2006.01)
|
|
MCD secondary class |
MCS |
B01D 53/94
(2006.01)
B01J 35/04
(2006.01)
F01N 3/08
(2006.01)
G01N 21/41
(2006.01)
G01N 21/55
(2014.01)
G01N 27/02
(2006.01)
|
|
MCD additional class |
MCA |
|
57 |
Abstract |
AB |
[DE] Die Erfindung betrifft ein Verfahren zur Bestimmung des Füllgrads oder der Güte eines mittels eines Speichermediums (12) Gase speichernden Katalysators (10), wobei die Änderung mindestens einer physikalischen Eigenschaft des mit dem Speichervorgang sich verändernden Speichermediums (12) gemessen wird und anhand dieser Ergebnisse der Füllgrad oder die Güte bestimmt wird. [EN] The method involves measuring the change of at least one physical property of the storage material (12) which changes during the storage process. The degree of filling or quality is determined. The process is used to determine the degree of filling or quality of a substance of a storage material (12) gas storage catalyst (10). Preferred process: The change of complex electrical impedance is measured. Measuring the complex impedance occurs at one or more frequencies from frequency range between 0 Hz, i.e. direct voltage and upper frequency boundary at which the wavelength corresponding to measuring frequency is essentially smaller than dimensions of measuring apparatus. |
56 |
Cited documents identified in the search |
CT |
DE000004112478A1
|
56 |
Cited documents indicated by the applicant |
CT |
|
56 |
Cited non-patent literature identified in the search |
CTNP |
|
56 |
Cited non-patent literature indicated by the applicant |
CTNP |
|
|
Citing documents |
|
Determine documents
|
|
Sequence listings |
|
|
|
Search file IPC |
ICP |
B01D 53/30
F01N 11/00
F01N 9/00
G01M 15/00 F
G01N 21/41
G01N 21/55
G01N 27/02
G01N 7/02
|