54 |
Title |
TI |
[DE] Planeten- Spektro- Diffraktometer [EN] Planetary spectrodiffractometer |
71/73 |
Applicant/owner |
PA |
Siemens AG, 1000 Berlin und 8000 München, DE
|
72 |
Inventor |
IN |
Kraeft, Uwe, Dipl.-Min., 6906 Leimen, DE
|
22/96 |
Application date |
AD |
Feb 25, 1985 |
21 |
Application number |
AN |
3506605 |
|
Country of application |
AC |
DE |
|
Publication date |
PUB |
Aug 28, 1986 |
33 31 32 |
Priority data |
PRC PRN PRD |
|
51 |
IPC main class |
ICM |
G01N 23/223
|
51 |
IPC secondary class |
ICS |
G01N 23/20
|
|
IPC additional class |
ICA |
|
|
IPC index class |
ICI |
|
|
Cooperative patent classification |
CPC |
G01N 2223/076
G01N 23/207
G01N 23/223
|
|
MCD main class |
MCM |
|
|
MCD secondary class |
MCS |
G01N 23/207
(2006.01)
G01N 23/223
(2006.01)
|
|
MCD additional class |
MCA |
|
57 |
Abstract |
AB |
[EN] Using an X-ray spectrometer according to Patent Application P 3438637.8, X-ray diffraction analyses are also performed in the spectrometer position when the analyser crystal is used as a monochromator. |
56 |
Cited documents identified in the search |
CT |
|
56 |
Cited documents indicated by the applicant |
CT |
|
56 |
Cited non-patent literature identified in the search |
CTNP |
|
56 |
Cited non-patent literature indicated by the applicant |
CTNP |
|
|
Citing documents |
|
No results
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|
Sequence listings |
|
|
|
Search file IPC |
ICP |
G01N 23/20
G01N 23/223
|