Bibliographic data

Document DE000003441539A1 (Pages: 10)

Bibliographic data Document DE000003441539A1 (Pages: 10)
INID Criterion Field Contents
54 Title TI [DE] Mehrkreis-Röntgen-Spektro-Diffraktometer = Röntgenautomat
[EN] Multi-circle X-ray spectrodiffractometer = automatic X-ray analyser
71/73 Applicant/owner PA Siemens AG, 1000 Berlin und 8000 München, DE
72 Inventor IN Kraeft, Uwe, Dipl.-Min., 6906 Leimen, DE
22/96 Application date AD Nov 14, 1984
21 Application number AN 3441539
Country of application AC DE
Publication date PUB May 15, 1986
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31
32		 Priority data PRC
PRN
PRD

51 IPC main class ICM G01N 23/223
51 IPC secondary class ICS G01N 23/20
IPC additional class ICA
IPC index class ICI
Cooperative patent classification CPC G01N 2223/076
G01N 23/207
G01N 23/223
MCD main class MCM
MCD secondary class MCS G01N 23/207 (2006.01)
G01N 23/223 (2006.01)
MCD additional class MCA
57 Abstract AB [EN] A demountable automatic X-ray analyser which has at least two concentric goniometer circles is used to carry out in a very simple way X-ray fluorescence analyses, X-ray diffraction analyses and crystal structure analyses in combination after interchanging the specimen positions and the crystals.
56 Cited documents identified in the search CT
56 Cited documents indicated by the applicant CT
56 Cited non-patent literature identified in the search CTNP
56 Cited non-patent literature indicated by the applicant CTNP
Citing documents CN000108956672A
US000005640437A
WO001994019682A1
Sequence listings
Search file IPC ICP G01N 23/20
G01N 23/223