Bibliographic data

Document DE000003438637A1 (Pages: 8)

Bibliographic data Document DE000003438637A1 (Pages: 8)
INID Criterion Field Contents
54 Title TI [DE] Röntgen-Spektro-Diffraktometer
[EN] X-ray spectrometer/defraction analyser
71/73 Applicant/owner PA Siemens AG, 1000 Berlin und 8000 München, DE
72 Inventor IN Kraeft, Uwe, Dipl.-Min., 6906 Leimen, DE
22/96 Application date AD Oct 22, 1984
21 Application number AN 3438637
Country of application AC DE
Publication date PUB May 15, 1986
33
31
32		 Priority data PRC
PRN
PRD

51 IPC main class ICM G01N 23/223
51 IPC secondary class ICS G01N 23/20
G05G 1/00
IPC additional class ICA
IPC index class ICI
Cooperative patent classification CPC G01N 2223/076
G01N 23/207
G01N 23/223
MCD main class MCM
MCD secondary class MCS G01N 23/207 (2006.01)
G01N 23/223 (2006.01)
MCD additional class MCA
57 Abstract AB [EN] By exchanging or combining the modules of the X-ray spectrometers and X-ray defraction analysers, it becomes possible to use one X-ray apparatus to carry out sequential or simultaneous X-ray fluorescence analyses and X-ray defraction analyses.
56 Cited documents identified in the search CT
56 Cited documents indicated by the applicant CT
56 Cited non-patent literature identified in the search CTNP
56 Cited non-patent literature indicated by the applicant CTNP
Citing documents No results
Sequence listings
Search file IPC ICP G01N 23/20
G01N 23/223
G05G 1/00