54 |
Title |
TI |
[DE] Vorrichtung zur optischen Abtastung mikroskopischer Objekte |
71/73 |
Applicant/owner |
PA |
LEITZ ERNST GMBH
|
72 |
Inventor |
IN |
KLAUS WEBER DR
|
22/96 |
Application date |
AD |
Aug 10, 1966 |
21 |
Application number |
AN |
1472293 |
|
Country of application |
AC |
DE |
|
Publication date |
PUB |
Jan 23, 1969 |
33 31 32 |
Priority data |
PRC PRN PRD |
DE
L 0054285
Aug 10, 1966
|
33 31 32 |
PRC PRN PRD |
DE
L 0055475
Jan 11, 1967
|
51 |
IPC main class |
ICM |
G01N 21/06
|
51 |
IPC secondary class |
ICS |
|
|
IPC additional class |
ICA |
|
|
IPC index class |
ICI |
|
|
Cooperative patent classification |
CPC |
G01N 21/5911
|
|
MCD main class |
MCM |
|
|
MCD secondary class |
MCS |
G01N 21/59
(2006.01)
|
|
MCD additional class |
MCA |
|
57 |
Abstract |
AB |
|
56 |
Cited documents identified in the search |
CT |
|
56 |
Cited documents indicated by the applicant |
CT |
|
56 |
Cited non-patent literature identified in the search |
CTNP |
|
56 |
Cited non-patent literature indicated by the applicant |
CTNP |
|
|
Citing documents |
|
Determine documents
|
|
Sequence listings |
|
|
|
Search file IPC |
ICP |
G02B 21/24 C
|