54 |
Title |
TI |
[EN] Stencil mask for high- and ultrahigh-energy implantation |
71/73 |
Applicant/owner |
PA |
INFINEON TECHNOPLOGIES AG, DE
|
72 |
Inventor |
IN |
RUEB MICHAEL, AT
|
22/96 |
Application date |
AD |
Apr 30, 2002 |
21 |
Application number |
AN |
13547402 |
|
Country of application |
AC |
US |
|
Publication date |
PUB |
Jun 29, 2004 |
33 31 32 |
Priority data |
PRC PRN PRD |
DE
10121181
20010430
|
51 |
IPC main class |
ICM |
G03F 9/00
|
51 |
IPC secondary class |
ICS |
|
|
IPC additional class |
ICA |
|
|
IPC index class |
ICI |
|
|
Cooperative patent classification |
CPC |
H01L 21/266
Y10T 428/24273
Y10T 428/24322
|
|
MCD main class |
MCM |
|
|
MCD secondary class |
MCS |
H01L 21/266
(2006.01)
|
|
MCD additional class |
MCA |
|
57 |
Abstract |
AB |
[EN] A stencil mask for high- and ultrahigh-energy implantation of semiconductor wafers has a substrate with implantation openings through which the implantation energy can be projected onto a wafer that will be implanted. The critical dimension of the implantation openings is defined in a manner dependent on the respective implantation energy. |
56 |
Cited documents identified in the search |
CT |
US000005512498A US000005972794A US000006110331A US000006214498B1 US000006300017B1 US000006468701B1 US020010046646A1
|
56 |
Cited documents indicated by the applicant |
CT |
US000006187481B1
|
56 |
Cited non-patent literature identified in the search |
CTNP |
|
56 |
Cited non-patent literature indicated by the applicant |
CTNP |
|
|
Citing documents |
|
Determine documents
|
|
Sequence listings |
|
|
|
Search file IPC |
ICP |
G03F 9/00
|