Bibliografische Daten

Dokument US020090159927A1 (Seiten: 33)

Bibliografische Daten Dokument US020090159927A1 (Seiten: 33)
INID Kriterium Feld Inhalt
54 Titel TI [EN] INTEGRATED CIRCUIT DEVICE AND METHOD FOR ITS PRODUCTION
71/73 Anmelder/Inhaber PA INFINEON TECHNOLOGIES AUSTRIA, AT
72 Erfinder IN KAINDL WINFRIED, DE ; RUEB MICHAEL, AT ; TOLKSDORF CAROLIN, DE ; WILLMEROTH ARMIN, DE
22/96 Anmeldedatum AD 21.12.2007
21 Anmeldenummer AN 96305707
Anmeldeland AC US
Veröffentlichungsdatum PUB 25.06.2009
33
31
32
Priorität PRC
PRN
PRD


51 IPC-Hauptklasse ICM H01L 29/739 (2006.01)
51 IPC-Nebenklasse ICS H01L 21/331 (2006.01)
H01L 21/336 (2006.01)
H01L 29/78 (2006.01)
IPC-Zusatzklasse ICA
IPC-Indexklasse ICI
Gemeinsame Patentklassifikation CPC H01L 29/0634
H01L 29/0653
H01L 29/0696
H01L 29/0839
H01L 29/1095
H01L 29/41766
H01L 29/42368
H01L 29/7396
H01L 29/7802
MCD-Hauptklasse MCM H01L 29/739 (2006.01)
MCD-Nebenklasse MCS H01L 21/331 (2006.01)
H01L 21/336 (2006.01)
H01L 29/78 (2006.01)
MCD-Zusatzklasse MCA
57 Zusammenfassung AB [EN] An integrated circuit device includes a semiconductor body fitted with a first electrode and a second electrode on opposite surfaces. A control electrode on an insulating layer controls channel regions of body zones for a current flow between the two electrodes. A drift section adjoining the channel regions comprises drift zones and charge compensation zones. A part of the charge compensation zones includes conductively connected charge compensation zones electrically connected to the first electrode. Another part includes nearly-floating charge compensation zones, so that an increased control electrode surface has a monolithically integrated additional capacitance CZGD in a cell region of the semiconductor device.
56 Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt
CT US000005047813A
US000006633064B2
US000006803609B1
US000007372100B2
US000007652326B2
US020040056284A1
56 Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt
CT
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt
CTNP
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt
CTNP
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Sequenzprotokoll
Prüfstoff-IPC ICP H01L 21/336
H01L 29/06
H01L 29/739
H01L 29/78