Bibliografische Daten

Dokument US020080237701A1 (Seiten: 6)

Bibliografische Daten Dokument US020080237701A1 (Seiten: 6)
INID Kriterium Feld Inhalt
54 Titel TI [EN] SEMICONDUCTOR COMPONENT AND METHOD FOR PRODUCING IT
71/73 Anmelder/Inhaber PA INFINEON TECHNOLOGIES AUSTRIA, AT
72 Erfinder IN RUEB MICHAEL, AT ; SCHMITT MARKUS, DE ; TOLKSDORF CAROLIN, DE ; WILLMEROTH ARMIN, DE
22/96 Anmeldedatum AD 03.10.2007
21 Anmeldenummer AN 86666207
Anmeldeland AC US
Veröffentlichungsdatum PUB 02.10.2008
33
31
32
Priorität PRC
PRN
PRD
DE
102006047489
20061005
51 IPC-Hauptklasse ICM H01L 29/76 (2006.01)
51 IPC-Nebenklasse ICS H01L 21/425 (2006.01)
IPC-Zusatzklasse ICA
IPC-Indexklasse ICI
Gemeinsame Patentklassifikation CPC H01L 29/0634
H01L 29/0696
H01L 29/1095
H01L 29/402
H01L 29/7811
MCD-Hauptklasse MCM H01L 29/76 (2006.01)
MCD-Nebenklasse MCS H01L 21/425 (2006.01)
MCD-Zusatzklasse MCA
57 Zusammenfassung AB [EN] A semiconductor component includes a semiconductor body having an edge with an edge zone of a first conductivity type. Charge compensation regions of a second conductivity type are embedded into the edge zone, with the charge compensation regions extending from a top side of the semiconductor component vertically into the semiconductor body. For the number Ns of charge carriers present in a volume Vs between two charge compensation regions that are adjacent in a direction perpendicular to the edge, and for the number Np of charge carriers present in a volume Vp between two charge compensation regions that are adjacent in a direction parallel to the edge, Np>Ns holds true.
56 Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt
CT US000006326656B1
US000006376890B1
US000006630698B1
US000006825565B2
US000006844592B2
US000006870201B1
US000006888195B2
US000006894329B2
US000007002205B2
US000007091557B2
US020020037636A1
US020020063281A1
US020020167020A1
US020020179942A1
US020030011046A1
US020040124465A1
US020060202264A1
56 Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt
CT
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt
CTNP
56 Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt
CTNP
Zitierende Dokumente Dokumente ermitteln
Sequenzprotokoll
Prüfstoff-IPC ICP H01L 21/425
H01L 29/06 E
H01L 29/78