| 54 |
Titel |
TI |
[EN] Method device and system for optical near-field scanning microscopy of test specimens in liquids |
| 71/73 |
Anmelder/Inhaber |
PA |
HUELS CHEMISCHE WERKE AG, DE
|
| 72 |
Erfinder |
IN |
KIRSTEIN STEFAN, DE
;
LOHR FRAUKE, DE
;
MERTESDORF MICHAEL, DE
;
SCHOENHOFF MONIKA, SE
|
| 22/96 |
Anmeldedatum |
AD |
09.05.1997 |
| 21 |
Anmeldenummer |
AN |
85416897 |
|
Anmeldeland |
AC |
US |
|
Veröffentlichungsdatum |
PUB |
17.11.1998 |
33
31
32 |
Priorität |
PRC
PRN
PRD |
DE
19631498
19960803
|
| 51 |
IPC-Hauptklasse |
ICM |
H01J 3/14
|
| 51 |
IPC-Nebenklasse |
ICS |
|
|
IPC-Zusatzklasse |
ICA |
|
|
IPC-Indexklasse |
ICI |
|
|
Gemeinsame Patentklassifikation |
CPC |
B82Y 20/00
B82Y 35/00
G01Q 10/06
G01Q 20/02
G01Q 30/14
G01Q 60/20
G01Q 60/22
|
|
MCD-Hauptklasse |
MCM |
G01N 37/00
(2006.01)
|
|
MCD-Nebenklasse |
MCS |
G01N 21/64
(2006.01)
G01Q 10/06
(2010.01)
G01Q 20/02
(2010.01)
G01Q 30/14
(2010.01)
G01Q 60/18
(2010.01)
G01Q 60/20
(2010.01)
G02B 21/00
(2006.01)
|
|
MCD-Zusatzklasse |
MCA |
|
| 57 |
Zusammenfassung |
AB |
[EN] A method, device, and system for optical near-field scanning microscopy on a test specimen in a liquid uses a light source that guides light focused on an optical fiber tip disposed near the test specimen. With the aid of the light beam extending largely parallel to the specimen surface, a diffraction pattern is formed downstream of the light source and the optical fiber tip. The diffraction pattern is detected and a resulting detection signal, which is indicative of a vibrational amplitude of the optical fiber tip, is used for controlling the distance between the optical fiber tip and the specimen, where the distance is related to the vibrational amplitude. Accordingly, optical near-field scanning microscopy may be performed in virtually any liquid, on non-smooth specimen surfaces, and on specimen surfaces whose features change with time. |
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
in Recherche ermittelt |
CT |
EP000000545538A1
EP000000701102A1
US000005693938A
|
| 56 |
Entgegengehaltene Patentdokumente/Zitate,
vom Anmelder genannt |
CT |
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
in Recherche ermittelt |
CTNP |
George J. Collins, Laser Focus World, vol. 31, No. 11, pp. 104 107, Nov. 1, 1995, Near Field Microscopy Moves into the Mainstream . 0;
Kenneth D. Weston, et al., Review of Scientific Instruments, vol. 67, No. 8, pp. 2924 2929, Aug. 1996, Near Field Scanning Optical Microscopy in Reflection: A Study of Far Field Collection Geometry Effects . 0;
Patrick J. Moyer, et al., Applied Physics Letter, vol. 68, No. 24, pp. 3380 3382, Jun. 10, 1996, High Resolution Imaging using Near Field Scanning Optical Microscopy and Shear Force Feedback in Water . 0
|
| 56 |
Entgegengehaltene Nichtpatentliteratur/Zitate,
vom Anmelder genannt |
CTNP |
|
|
Zitierende Dokumente |
|
Dokumente ermitteln
|
|
Sequenzprotokoll |
|
|
|
Prüfstoff-IPC |
ICP |
G01N 21/17
G12B 21/06
|
